IFIN-HH

ornaments, toreutics, weapons, coins;

pictorial and ceramic pigments, inks and manuscript ornaments, obsidian

Atomic spectrometry methods (non-destructive):

• X-ray fluorescence (XRF) using fixed spectrometers (elementary analyzes in the laboratory) and portable (in situ analyzes - directly in museums, galleries, collections); elements analyzed: from potassium to uranium; minimum amount detected: 300-500 ppm (parts per million); analyzed surface: 30 mm diameter; analyzed depth: 30-60 microns depending on the material

• PIXE - (Proton Induced X-ray Emission) - 3 MeV Proton Induced X-ray Emission; through international collaborations: micro-PIXE and micro-SR-XRF (Synchrotron Radiation - X-Ray Fluorescence); elements analyzed: from magnesium to uranium; minimum amount detected: 5-10 ppm (parts per million); scanned analyzed surface: up to 25x25 mm for determining the microstructure by elementary maps; analyzed depth: 30-60 microns, depending on the material