journal2006

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[~2006]

5. Non-Quasi-Static Small-Signal Modeling and Analytical Parameter Extraction of SOI FinFETs

In Man Kang, Hyungcheol Shin

IEEE Transactions on Nanotechnology (May, 2006)

4. The Analysis of Dark Signals in the CMOS APS Imagers From the Characterization of Test Structures

Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park

IEEE Transactions on Electron Devices (Fabruary, 2004)

3. Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements

Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee

Microelectronics Reliability (January, 2004)

2. Characteristics of Conventional STI Process-Related Deep Level Traps in Silicon

In Man Kang, Hyuck In Kwon, Myung Won Lee, Byung-Gook Park and Jong Duk Lee

Journal of Korean Physical Society (January, 2004)

1. Effects of Electrical Stress on the Mid-Gap Interface Trap Density and the Capture Cross Sections Characterized by Pulsed Interface Probing (PIP) Measurements

Hyuck In Kwon, In Man Kang, Byung-Gook Park and Jong Duk Lee

Journal of Korean Physical Society (January, 2004)