* 논문 제목 클릭 시, 논문 사이트로 이동 가능 (SCI/SCIE 논문에 한해 서비스 제공) *
[~2006]
5. Non-Quasi-Static Small-Signal Modeling and Analytical Parameter Extraction of SOI FinFETs
In Man Kang, Hyungcheol Shin
IEEE Transactions on Nanotechnology (May, 2006)
4. The Analysis of Dark Signals in the CMOS APS Imagers From the Characterization of Test Structures
Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park
IEEE Transactions on Electron Devices (Fabruary, 2004)
Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee
Microelectronics Reliability (January, 2004)
2. Characteristics of Conventional STI Process-Related Deep Level Traps in Silicon
In Man Kang, Hyuck In Kwon, Myung Won Lee, Byung-Gook Park and Jong Duk Lee
Journal of Korean Physical Society (January, 2004)
Hyuck In Kwon, In Man Kang, Byung-Gook Park and Jong Duk Lee
Journal of Korean Physical Society (January, 2004)