XPS (X-ray photoelectron spectroscopy) PHI500 VersaProbe アルバック・ファイ
XPS spectra are obtained by irradiating a solid surface with a beam of X-rays while simultaneously measuring the kinetic energy of electrons that are emitted from the top 1-10 nm of the material being analyzed. The energies and intensities of the photoelectron peaks enable identification and quantification of all surface elements (except hydrogen).
By measuring the kinetic energy of the emitted electrons, it is possible to determine which elements are near a material’s surface, their chemical states and the binding energy of the electron.
-1h3000jyppy
· https://lcnet.t.u-tokyo.ac.jp/facility/list/spm/
· okitsu@soyak.t.u-tokyo.ac.jp
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· 2021: Seo, Ming,Yongjia