Table of Contents
Preface
Acknowledgments
1.0 Reliability Definitions
2.0 Availability
3.0 Reliability Bathtub Curve
4.0 Exponential Distribution
5.0 Estimating MTBF
6.0 Censoring and MTBF Calculations
7.0 Reliability Prediction
8.0 Confidence Intervals for MTBF
8.1 Testing to a predetermined number of failures
8.2 Testing for a predetermined time
8.3 Failure-free testing
9.0 System Reliability
9.1 Series systems
9.2 Parallel systems
9.2.1 Active parallel systems
9.2.2 Binomial distribution
9.3 Standby parallel systems
9.3.1 Equal failure rates - perfect switching
9.3.2 Unequal failure rates - perfect switching
9.3.3 Equal failure rates - imperfect switching
9.3.4 Unequal failure rates - imperfect switching
9.4 Shared load parallel systems
10.0 Bayes' Theorem Application
11.0 BETA Distribution
12.0 Nonparametric and Related Test Designs
12.1 Calculating reliability in zero failure situations
12.2 Sample size determination
13.0 Hazard Function
14.0 Wearout Distribution
15.0 Conditional Probability of Failures
16.0 Weibull Distribution
17.0 Log-normal Distribution
18.0 Stress-Strength Interference
19.0 Binomial Confidence Intervals
20.0 Chi-square Approximation for Poisson Confidence Intervals
21.0 Arrhenius Model
22.0 Sequential Testing
22.1 Introduction
22.2 Sequential testing when the exponential distribution is appropriate
22.2.1 Accumulating total test time
22.3 Accumulating failures
22.4 Use of the Weibull distribution for sequential testing
23.0 Tables
Bibliography
Index