Introduction to Atomic Force Microscopy (AFM) and related applications
Introduction to Atomic Force Microscopy (AFM) and related applications
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Speaker: Subhajit Nandy
Speaker: Subhajit Nandy
Venue : HSB 209
Venue : HSB 209
Date : 18th May, 2018
Date : 18th May, 2018
Time : 5.15 p.m.
Time : 5.15 p.m.
Abstract
Abstract
This talk mainly aims to provide a general review of working principle and data analysis of atomic force microscopy (AFM). It includes not only AFM but also the basic ideas of magnetic force microscopy (MFM) and piezoelectric force microscopy (PFM). Since its invention (1986), AFM has played a crucial role in nano-scale science and technology. AFM is an amazing technique that allies a versatile methodology to image nano-scale phenomena in a variety of research fields including physics, chemistry, biology and engineering. It is a microscopic technique using attractive and repulsive forces between a few atoms attached at the tip on a cantilever and a sample.
About the speaker
About the speaker
Subhajit Nandy is a research scholar from Department of Physics. He is currently working on photocurrent and photovoltaic applications of perovskite oxide materials under the supervision of Dr. Sudakar Chandran.
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