Probe & Lumped
中文/English
1. Select the Probe fields or Lumped element circuits
1. Select the Probe fields or Lumped element circuits
Probe :
Probe :
Electric field (E), magnetic field (H), Voltage (V), Current (I)
(Probe fields are using Fast Fourier Transform, FFT)
Lumped element circuit :
Lumped element circuit :
voltage source, current source, Resistor, Inductance , Capacitor, Wire, Load Wire (*.stl)
Load Wire (*.stl)
If the layer thickness (ex. FR-4 PCB, copper layer) is much less than resolution delta (dx)
(Structure thickness << dx)
Then use the Load Wire method, can tune the resolution order to get the better structure
2. Checked out the Probe fields or Lumped elements correct or not.
2. Checked out the Probe fields or Lumped elements correct or not.
3. Press 【創建 Create】 button to create Probe & Lumped element
3. Press 【創建 Create】 button to create Probe & Lumped element
(Even doesn't use probe field or lumped element, also need to press this button to create void grids )
Detailed Instructions :
Detailed Instructions :
Probe Electric field in Ex, Ey, Ez or |E|= sqrt(Ex^2+Ey^2+Ez^2), (without directional)
Probe Magnetic field in Hx, Hy, Hz or |H|= sqrt(Hx^2+Hy^2+Hz^2), (without directional)
Probe Voltage filed in x, y, z direction
Probe Current field in x, y, z direction
集總元件 (Lumped element circuit)
集總元件 (Lumped element circuit)
Voltage Source, (directional)
Current Source, (directional)
Resistor (Without directional)
inductance (Without directional)
Capacitor (Without directional)
Wire
(Load Wire *.stl)
Load Wire (*.stl)
If the layer thickness (ex. FR-4 PCB, copper layer) is much less than resolution delta (dx)
(Structure thickness << dx)
Then use the Load Wire method, can tune the resolution order to get the better structure