Probe & Lumped

中文/English

1. Select the Probe fields or Lumped element circuits

Probe :

Electric field (E), magnetic field (H), Voltage (V), Current (I)

(Probe fields are using Fast Fourier Transform, FFT)


Lumped element circuit :

voltage source, current source, Resistor, Inductance , Capacitor, Wire, Load Wire (*.stl)

Load Wire (*.stl)
If the layer thickness (ex. FR-4 PCB, copper layer) is much less than resolution delta (dx)
(Structure thickness << dx)
Then use the Load Wire method, can tune the resolution order to get the better structure 


2. Checked out the Probe fields or Lumped elements correct or not.

3. Press 【創建 Create】 button to create Probe & Lumped element

(Even doesn't use probe field or lumped element, also need to press this button to create void grids )



Detailed Instructions :


Probe Electric field in Ex, Ey, Ez or |E|= sqrt(Ex^2+Ey^2+Ez^2), (without directional)


Probe Magnetic field in Hx, Hy, Hz or |H|= sqrt(Hx^2+Hy^2+Hz^2), (without directional)


Probe Voltage filed in x, y, z direction


Probe Current field in x, y, z direction




集總元件 (Lumped element circuit)


Voltage Source, (directional)


Current Source, (directional)


Resistor (Without directional)


inductance (Without directional)


Capacitor (Without directional)


Wire

(Load Wire *.stl)

Load Wire (*.stl)
If the layer thickness (ex. FR-4 PCB, copper layer) is much less than resolution delta (dx)
(Structure thickness << dx)
Then use the Load Wire method, can tune the resolution order to get the better structure