LME multiuser platform address:
https://pnipe.mcti.gov.br/laboratory/1729

The following activities are carried out in the Electronic Microscopy Laboratory:

• Sample characterization by Scanning Electron Microscopy (secondary electron imaging, electron backscattered imaging, electron backscatter diffraction, energy dispersive X-ray spectroscopy, analysis of gun shot residue;

• Sample characterization by Transmission Electron Microscopy (image and selected area diffraction).

The following equipments are available:

• FEI (SEM-FEG) scanning electron microscope with field emission gun; 

• JEOL scanning electron microscope; 

• JEOL transmission electron microscope; 

• 3 energy dispersion X-ray microanalysis accessories; 

• microtexture accessories; 

• LEICA EM ACE 600 equipment for carbon spraying carbon and deposition of gold, platinum, chromium, platinum and tungsten by sputtering; 

• GTAN equipment for cutting and polishing samples for transmission electron microscopy. 

• Transmission electron microscope with Thermo Fisher field-emission gun (FEG-TEM).

• Leica ion polisher (“ion milling”), model RES 102.

Area: 70 m².

Contacts: Prof. Marcelo Henrique Prado da Silva (Head of LME) – marceloprado@ime.eb.br
                Prof. Andersan dos Santos Paula – andersan@ime.eb.br
                Technician Leandro Silva de Almeida – leandroalmeida@ime.eb.br

To schedule analyses on the FEG-SEM, the user should follow these steps:

• View the public calendar at: https://calendar.app.google/WAuFUMxXzxf4EpR1A

• Choose an available day.

• Send an email to technician Leandro Almeida requesting an appointment, if the requested analysis involves the FEG-SEM.
  
  

For analyses on other equipment, simply contact the head or the technician of the LME.