Post date: 29-Sep-2010 08:35:24
THE TOP THREE PROTOTYPING CHALLENGES IN ROBOTICS
DATE: Thursday, Sep 30, 2010
TIME: 2:00 PM ET / 11:00 AM PT / 18:00 GMT
(Duration: 1 hour)
Part of Build a Prototype Webinar Series
DESCRIPTION: Robotics is one of the fastest-growing and most complex engineering fields. Almost every type of robot operates in a different environment and has a different behavior or mission. Three of the biggest challenges that developers face when prototyping robots are:
Integrating with sensors and actuators
Implementing autonomy
Deploying deterministic control algorithms to embedded hardware
Learn how the latest design tools from National Instruments can help you meet these challenges and shorten your development time.
PRESENTER:
Meghan Kerry, Product Marketing Manager for Robotics, National Instruments
Meghan is currently focused on robotics and autonomous system design, she is responsible for the development strategy and worldwide promotion of LabVIEW for robotics, mechatronics, and controls in academic teaching and research. She holds a Bachelor of Mechanical Engineering from the University of Tennessee.
Todd Dobberstein, Group manager of embedded hardware for National Instruments
Todd's product expertise consists of packaged and board-level embedded hardware including FPGA, real-time and embedded I/O hardware technologies. He has experience in embedded and industrial control systems, medical devices, machine monitoring, and automotive and in-vehicle applications. He holds a bachelor’s degree in electrical engineering with a specialization in bioengineering from Kansas State University.
MODERATOR:
Dexter Johnson
Analyst at Cientifica, a business intelligence company for emerging technologies
Author and Editor of several market reports on nanotechnology
Contributing editor for IEEE Spectrum’s Tech Talk
Program Director for numerous international conferences on nanotechnology, fiber optic telecommunications and IT
WHO SHOULD ATTEND:
No prerequisites. All technology enthusiasts can attend
Register at IEEE website