Tony Bell: The reestablishment of the "OXI" XRF standard analysis method at Sheffield Hallam University.
Malcolm Haigh: Applications of Mapping by WD-XRF
David Beveridge: XRF Determination of Silver in Photographic Emulsion
Rainer Schramm: How to make sure your XRF delivers reliable results from day one until the end of its life?
Andy Scothern: The Analysis of Suspended Particulate Matter using ED-XRF
Martin Lischka: Biasing pitfalls in sample preparation for XRF analysis,
Kai Behrens: How to accomplish optimally todays analytical tasks with latest XRF! A guideline how to evaluate current XRF technologies!