12 June 2019

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This joint XRF meeting is on Wednesday 12th June 2019 at Sheffield Hallam University.

Information for Delegates. Click here...

Registration: is now closed.

Register here... REGISTRATION CLOSES at 23:59 on Thursday 6th June 2019.

Fees: £100 or £50 concessions - for BCA members £65 or £32.50 concessions.

For registrations queries please contact: Joanne McBratney, Tel +44 (0)1423 529333 Email: joanne.mcbratney@hg3.co.uk

A limited number of FREE STUDENT PLACES are available at this meeting.To apply please E-mail David Beveridge with your name, E-mail address and Institution for details of how to apply for a FREE place. Successful applicants will be sent details of how to register for the meeting.

This meeting offers a great opportunity for both novice and experienced users to enhance their XRF knowledge and discuss their requirements with major XRF suppliers in the exhibition.


DELEGATE BOOKLET a preview of the printed version in the delegate pack

Abstracts... Presentations and Posters.

POSTER SESSION: submit your poster now!

Pens Sponsored by: SciMed & Datech Scientific Limited

Pads Sponsored by: Datech Scientific Limited

9:30 Registration & Coffee Sponsored by: Malvern Panalytical Ltd

9:55 Welcome Tony Bell. Chair: Heather Harrison

10:00 The reestablishment of the "OXI" XRF standard analysis method at Sheffield Hallam University, Tony Bell, Sheffield Hallam University.

10:30 Exhibitor Forum. More information...

11:15 Coffee + Exhibition Sponsored by: Specac Ltd

Chair: Tony Bell

11:45 Light element mapping by WD-XRF, Malcolm Haigh, SciMed.

12:15 XRF Determination of Silver in Photographic Emulsion, David Beveridge, HARMAN technology Limited.

12:45 Lunch & Exhibition Sponsored by: XRF Scientific.

Chair: David Beveridge

14:00 How to make sure your XRF delivers reliable results from day one until the end of its life? Rainer Schramm, FLUXANA GmbH & Co.

14:30 The Analysis of Suspended Particulate Matter using ED-XRF, Andrew Scothern, MalvernPanalytical.

15:00 Tea & Exhibition Sponsored by: Umicore MS UK Ltd.

Chair: Tony Bell

15:30 Biasing pitfalls in sample preparation for XRF analysis, Martin Lischka, HERZOG Maschinenfabrik GmbH.

16:00 How to accomplish optimally todays analytical tasks with latest XRF! A guideline how to evaluate current XRF technologies! Kai Behrens

16:30 Close.

To offer a talk for this meeting please contact the webeditor.

See the report of our last meeting here....