12 June 2019
This joint XRF meeting is on Wednesday 12th June 2019 at Sheffield Hallam University.
Information for Delegates. Click here...
Registration: is now closed.
Register here... REGISTRATION CLOSES at 23:59 on Thursday 6th June 2019.
Fees: £100 or £50 concessions - for BCA members £65 or £32.50 concessions.
For registrations queries please contact: Joanne McBratney, Tel +44 (0)1423 529333 Email: firstname.lastname@example.org
A limited number of FREE STUDENT PLACES are available at this meeting.To apply please E-mail David Beveridge with your name, E-mail address and Institution for details of how to apply for a FREE place. Successful applicants will be sent details of how to register for the meeting.
This meeting offers a great opportunity for both novice and experienced users to enhance their XRF knowledge and discuss their requirements with major XRF suppliers in the exhibition.
DELEGATE BOOKLET a preview of the printed version in the delegate pack
Abstracts... Presentations and Posters.
POSTER SESSION: submit your poster now!
Pens Sponsored by: SciMed & Datech Scientific Limited
Pads Sponsored by: Datech Scientific Limited
9:30 Registration & Coffee Sponsored by: Malvern Panalytical Ltd
9:55 Welcome Tony Bell. Chair: Heather Harrison
10:00 The reestablishment of the "OXI" XRF standard analysis method at Sheffield Hallam University, Tony Bell, Sheffield Hallam University.
10:30 Exhibitor Forum. More information...
11:15 Coffee + Exhibition Sponsored by: Specac Ltd
Chair: Tony Bell
11:45 Light element mapping by WD-XRF, Malcolm Haigh, SciMed.
12:15 XRF Determination of Silver in Photographic Emulsion, David Beveridge, HARMAN technology Limited.
12:45 Lunch & Exhibition Sponsored by: XRF Scientific.
Chair: David Beveridge
14:00 How to make sure your XRF delivers reliable results from day one until the end of its life? Rainer Schramm, FLUXANA GmbH & Co.
14:30 The Analysis of Suspended Particulate Matter using ED-XRF, Andrew Scothern, MalvernPanalytical.
15:00 Tea & Exhibition Sponsored by: Umicore MS UK Ltd.
Chair: Tony Bell
15:30 Biasing pitfalls in sample preparation for XRF analysis, Martin Lischka, HERZOG Maschinenfabrik GmbH.
16:00 How to accomplish optimally todays analytical tasks with latest XRF! A guideline how to evaluate current XRF technologies! Kai Behrens
To offer a talk for this meeting please contact the webeditor.
See the report of our last meeting here....