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Scanning Electron Microscope JEOL JSM-7600F (Chemistry) (CCRL06)
Status: Working.
Located in room 3216F SNR of Chemistry Building on the Statesboro Campus.
Below the Specifications is the calendar to schedule appointments to the SEM scope. If a time slot is missing then someone has already booked that time so pick another slot. Please make sure to always sign up on the schedule appointment calendar before coming to use the Chem SEM.
You must be logged into a @georgiasouthern.edu or Gmail account to reserve instrument time on the calendar.
Point of contact: Andrew Diamanduros - adiamanduros@georgiasouthern.edu
Specifications:
The JEOL JSM-7600F is a Field Emission Scanning Electron Microscope (FE-SEM) designed for high-resolution imaging and analytical characterization of a wide variety of samples. It's especially useful for studying materials at the nanoscale.
Samples of the JEOL JSM-7600F can be used for:
Materials Science and Nanotechnology: Surface morphology, composition, and structure of materials including nanoparticles, nanotubes, and thin films.
Biological Samples: High-resolution imaging of biological specimens, such as cell surface features and the distribution of nanoparticles within cells, often in conjunction with techniques like colloidal gold-labeling.
Semiconductors: Cross-section analysis of semiconductor devices for studying features like gate widths, gate oxides, and film thicknesses, as well as detecting small contamination features and determining their elemental composition.
Engineering and Manufacturing: Analyzing advanced coating thickness and structure uniformity, identifying defects in materials (e.g., cracks due to stress corrosion), and failure analysis.
Food/Plant/Pesticides: Applications in these areas are also mentioned.
Capabilities of the JEOL JSM-7600F:
Ultra-high resolution imaging: Using a Field Emission Gun (FEG) that allows for better brightness, contract and resolution to enable visualization and imaging of nanoscale objects with high resolution down to 2 nm.
Versatile specimen chamber: Accommodates samples up to 200 mm in diameter and includes ports for a variety of detectors, allowing users to choose the optimal setup for their analysis.
Multiple detectors: Equipped with secondary electron detectors (including in-lens and low-angle), back scattered electron detector, and Scanning Transmission Electron (STEM) detector.
Analytical capabilities: Features Energy Dispersive X-ray Spectroscopy (EDS) with Oxford Instruments X-max Silicon Drift Detector and AZtec software for elemental analysis and compositional mapping.
Low voltage imaging (Gentle Beam mode): Allows for imaging of charging samples (like nonconductive materials) and minimizes beam damage on delicate samples.
High probe current: Provides a stable, high probe current (up to 200 nA at 15 kV) for optimized analytical performance.
High magnification: Can magnify images up to one million times.
5-Axis Motor Stage: A eucentric stage allows for precise sample manipulation, including tilting and rotation.
Software and User Interface: Features a user-friendly interface and supports simultaneous acquisition of data from multiple detectors for increased efficiency.
In summary, the JEOL JSM-7600F is a powerful and versatile FE-SEM well-suited for a wide range of research applications demanding high-resolution imaging and comprehensive analytical characterization of various materials.
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