SEM JEOL JSM-6610LV

Scanning Electron Microscope JEOL JSM-6610LV (Biology) (CCRL01)

Status: Working SEM and Working Sputter coater

Located in room 1116B of Biological Sciences Building of the Statesboro Campus.

Below the Specifications is the calendar to schedule appointments to the SEM scope. If a time slot is missing then someone has already booked that time so pick another time. Please make sure to always sign up on the schedule appointment calendar Before coming to use the Bio SEM.

You must be logged into a @georgiasouthern.edu or Gmail account to reserve instrument time.
Point of contact: Andrew Diamanduros - adiamanduros@georgiasouthern.edu

Specifications:

The JEOL JSM-6610LV is a versatile scanning electron microscope (SEM) equipped with features that allow for detailed imaging and analysis of a wide range of materials. Here's a summary of its capabilities and the types of samples it can handle:

Sample Types:

The JEOL JSM-6610LV is suitable for analyzing a diverse range of sample types, including:

Conducting and Non-Conducting Samples: The instrument is capable of imaging and analyzing both types of materials, especially with its low vacuum capabilities for non-conductive samples.
Fragile Materials: The low vacuum mode allows for high-resolution imaging and chemical analysis of fragile materials without requiring a conductive coating but with loss of resolution.
Biological, Geological, Anthropological, and Archeological Samples: The instrument offers various analysis and imaging methods to investigate these solid sample types.
Samples of Various Shapes and Sizes: The large chamber and different stub holders allow for flexibility in sample size and shape.
Small pieces up to 4-inch wafers: The instrument has substrate compatibility for varying sizes, from small pieces to larger wafers.

Capabilities:

High-Resolution Imaging: The JSM-6610LV can achieve a point-to-point resolution of 3 nm at 30 kV, enabling the observation of fine structures.
Large Sample Handling: It features a large imaging chamber capable of accommodating specimens up to 200 mm in diameter and 80 mm in height.
Dual Live Imaging: Users can compare secondary electron images with back-scattered composition images to evaluate contrasting features of a sample.
Elemental Analysis (with EDS): The Biology SEM does not have an EDS currently.
Low Vacuum Mode: The JSM-6610LV offers a low vacuum mode, which is particularly useful for imaging specimens that are sensitive to high vacuum conditions, such as those with very low water content or non-conductive materials, without the need for a conductive coating but with loss of resolution.

In essence, the JEOL JSM-6610LV SEM is a versatile tool for high-resolution imaging and characterization of microstructures and elemental composition in a variety of solid materials, even those that may be difficult to analyze under traditional high vacuum conditions.

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