2011
Conference
[C22] R. Vaddi and T. Kim, "Ultra-low Power High Efficient Rectifiers with 3T/4T Double-gate MOSFETs for RFID Applications," International Symposium on Integrated Circuits, pp. 611-614, Dec. 2011
[ISOCC'11] [IEEE SSCS Seoul Chapter Award][Invited to JSTS] T. Kim and Z. Kong, "Impacts of NBTI/PBTI on SRAM VMIN and Design Techniques for SRAM VMIN Improvement," International SoC Design Conference, pp. 163-166, Nov. 2011 [Paper]
[ISOCC'11] Q. Li and T. Kim, "Analysis of SRAM Hierarchical Bitlines for Optimal Performance and Variation Tolerance," International SoC Design Conference, pp. 412-415, Nov. 2011
[IRPS'11] J. Kim, B. Linder, R. Rao, T. Kim, P. Lu, K. Jenkins, C. Kim, A. Bansal, S. Mukhopadhyay, and C. Chuang, “Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies,” IEEE International Reliability Physics Symposium, pp. 47-50, Apr. 2011 [Paper]
Journal
[JLPEA'11] R. Vaddi, R. P. Agarwal, S. Dasgupta, and T. Kim, "Design and Analysis of Double-gate MOSFETs for Ultra-low Power Radio Frequency Identification (RFID): Device and Circuit Co-design," Journal of Low Power Electronics and Applications, pp. 277-302, July 2011 [Paper]
