This research line delves into the basic understanding of material properties, defect mechanisms, structural phases, and the development and application of advanced spectroscopic and microscopic techniques to achieve nanoscale insights. 

First principle calculations within the Density Functional Theory (DFT) framework and simulations of dynamic process in nanomaterials, such as light propagation and confinement or macroscale multiphysics simulations are also used for a comprehensive understanding of the experimental results and for devices designing.

This line extensively uses a range of advanced characterization techniques to reveal structure-property relationships at the nanoscale. Our group uses a quite complete characterization approach with the help of scanning electron microscopes to assess a high number of secondary effects due the the electron beam - matter interaction (EBSD, EDS, CL, EBIC) at high spatial resolution. In addition, various forms of optical spectroscopy (Photoluminescence, Raman spectroscopy, and near-field techniques, as scanning tunneling microscopy (STM) and Atomic Force Microscopy (AFM) are also extensively utilized in the group. These techniques are often combined in a "multimodal" approach for comprehensive sample understanding.

Moreover, we regularly use singular facilities (e.g: Elettra, ESRF, ALBA synchrotrons), for specific tasks in this research line.