A Scanning Electron Microscope (SEM) is a microscope that uses a focused electron beam (e-beam) to scan the surface of a sample. The SEM uses electromagnetic lenses to control the electrons trajectory like optical lenses in a conventional optical microscope. The focused e-beam interacts with the sample generating secondary electrons (SE) as result of the inelastic scattering with shallow electrons (few nm depth), providing highly detailed information about the topography and surface features. Unlike a light source in a conventional optical microscope, the electrons in a SEM have a shorter wavelength (of the order of pm) allowing for creating high-resolution images exceeding 50,000× magnification easily. A SEM generally operates at high vacuum (~10-6 Torr), contributing to even higher resolution by minimizing scattering during the free trajectory and increasing e-beam penetration. The electron energy in a SEM can be controlled in a range from a few hundred eV to 30 keV, so the importance of a SEM is due to the capability to perform a variety of methods for materials characterization with high spatial resolution.