Atomic Force Microscope (AFM) is a cornerstone nanotechnology tool that enables high-resolution surface characterization at the nanoscale. Its core function is to generate precise topographical maps and quantify diverse localized surface properties by scanning a sharp probe across a sample. The fundamental principle of AFM relies on detecting minute interatomic forces between the probe tip and the sample surface, which induce a measurable deflection of a flexible cantilever. This deflection, typically monitored by a laser detection system, allows for the reconstruction of surface topography or the mapping of various material characteristics. Why AFM is important stems from its unparalleled capability to provide insights into physical, chemical, and biological phenomena at an unprecedented resolution, unconstrained by sample conductivity or environment. This versatility, augmented by a wide array of specialized tips, makes AFM an indispensable technique across numerous scientific disciplines, including materials science, semiconductor research, and life sciences, driving advancements in fundamental understanding and technological innovation.