Other SEMs

The FINE Group maintains three more Scanning Electron Microscopes (SEMs), which are reserved for specific, dedicated applications. These instruments, categorized by manufacturer and primary function, include:

1. Leica 440: Dedicated to Energy Dispersive X-ray spectroscopy (EDS) by Bruker AXS 4010,  Cathodoluminescence (CL) and Electron Beam-Induced Current (EBIC) by homemade parts.

2. Hitachi S-2500: Utilized for temperature-controlled EBIC and CL analysis, employing liquid nitrogen for thermal regulation.

3. Hitachi TM3000: Performed EDS by Quantax70 Silicon Drift Detector and Backscattered Electrons (BSE) by Solid State 4-Segment Detector.