Electron Microscopy

The SEM Zeiss EVO 40 provides high-level scanning electron microscopy, combining outstanding performance with an intuitive interface, making it suitable for both experts and less experienced users.

Thanks to its wide range of accessories, the EVO 40 is perfectly suited for various applications, from biological sciences to materials research and industrial quality control. The instrument delivers high-quality images and analytical results, even for non-conductive and uncoated samples. The automation of workflows and the reliability of data ensure optimal performance for any analytical requirement.

TECHNICAL SPECIFICATIONS

• Source: LaB₆ (Lanthanum Hexaboride)

• Maximum acceleration voltage: 30 kV

• Secondary electron detector for imaging in the presence of gas

• Energy Dispersive Spectroscopy (EDS) spectrometer for X-ray microanalysis

• Operating modes: high vacuum and variable pressure (SEM XVP); maximum pressure 6 torr

• EDS detector (Energy Dispersive X-ray Analysis) for qualitative and quantitative microanalysis

• EBSD detector (Electron Backscatter Diffraction) for crystallographic studies

The ZEISS Gemini 460 Field Emission Scanning Electron Microscope (FE-SEM) combines cutting-edge innovations in electron optics with an optimized chamber design, delivering exceptionally sharp images with sub-nanometer resolution while simplifying the acquisition process.

One of the key features of this instrument is its ability to operate at extremely low voltages (even below 1 kV) without compromising image quality. Additionally, the FEG (Field Emission Gun) source ensures greater longevity and higher brightness compared to thermionic sources, contributing to the acquisition of ultra-high-resolution images.

TECHNICAL SPECIFICATIONS

• Source: Field Emission Gun (FEG)

• Column: Gemini 2 ultra-high resolution

• Acceleration voltage range: from 20 V to 30 kV with a minimum step of 10 V

• Acceleration: 8 kV with Beam Booster, enabling operation at extremely low energies to minimize charging effects and allowing high-vacuum analysis of poorly conductive samples

• Magnification range: from 8x to 2,000,000x

• Large chamber size: 365 mm in diameter with 12 accessory ports

• Ultra-clean vacuum system: ion pump, turbomolecular pump, and rotary pump

• Cooling system with Cool Stage for the analysis of fresh samples

The CytoViva™ Hyperspectral Microscope combines dark-field microscopy with spectroscopy to obtain both qualitative and quantitative chemical-physical information.

This microscope is equipped with a hyperspectral camera, enabling spectrographic imaging from the ultraviolet to the near-infrared range. Hyperspectral imaging is based on three dimensions: two spatial (x, y) and one spectral (λ). By analyzing intensity scattering at different wavelengths, it generates a spectral signature—a unique spectral fingerprint of the elements present in the sample. This allows researchers to differentiate, for example, between physiological and pathological cellular or tissue conditions.

Due to its broad range of applications—including biomedical research, environmental sciences, and materials science—this technique is highly versatile.

TECHNICAL SPECIFICATIONS

• Capability to visualize samples in transmitted light, dark-field, and hyperspectral imaging

• LED illumination source

• V10E Spectrograph

• sCMOS Spectral Camera for VNIR (Visible and Near-Infrared) Imaging Spectrograph, enabling spectrographic imaging in the visible and near-infrared range

• Motorized Upright Stage (120 mm x 80 mm) with 10 nm step resolution

• Retiga R6 QI695 16-bit USB Cooled Color Optical Camera, designed for high-resolution still and video optical image capture

• CytoViva Software for hyperspectral imaging and analysis

Thanks to cutting-edge innovations in electron optics and an optimized chamber design, the ZEISS Gemini 460 field emission scanning electron microscope (FE-SEM) delivers exceptionally sharp images with sub-nanometer resolution, simplifying the acquisition process.

A key feature of this instrument is its ability to operate at very low voltages (e.g., below 1 kV) without compromising image quality. Additionally, the FEG (Field Emission Gun) source provides greater longevity and brightness compared to thermionic sources, contributing to the acquisition of ultra-high-resolution images.

TECHNICAL SPECIFICATIONS

• Field Emission Source

• "Gemini 2" ultra-high-resolution column

• Acceleration voltage range: 20V to 30kV, with a minimum step of 10V

• 8kV acceleration voltage with Beam Booster, allowing operation at extremely low energies to minimize charging effects and enable high-vacuum imaging of poorly conductive samples

• Magnification range: 8x to 2,000,000x

• Large chamber (365 mm diameter) with 12 accessory ports

• Ultraclean vacuum system with ion pump, turbomolecular pump, and rotary pump

• Cooling system

• Cool stage, enabling the analysis of fresh samples