(This is from the original 1993 list with updates pending.)
Azzam, R. M. A. and N. M. Bashara (1977), Ellipsometry and Polarized Light (North-Holland), ISBN 0-444-87016-4 (pb), Call no. QC 443 A96.
Berry, R. W. and P. M. a. H. Hall, Murray T. (1968), Thin Film Technology (Van Nostrand Reinhold), ISBN 0-442-00717-5.
Brodie, I. and J. J. Muray (1982), The physics of microfabrication (Plenum), ISBN 0-306-40863-5, Call no. TK 7874 B73.
Carlson, T. A. (1975), Photoelectron and Auger Spectroscopy (Plenum), ISBN 0-306-33901-3, Call no. QD 96 E44 C3.
Chopra, K. L. (1969), Thin film phenomena (McGraw-Hill).
Heavens, O. S. (1965), Optical Properties of Thin Solid Films (Dover), ISBN (pb).
Ibach, H. (1991), Electron energy loss spectrometers: the technology of high performance (Springer), ISBN 0-387-52818-0, Call no. QC 454 E4 I218 1990.
Lüth, H. (1993), Surfaces and interfaces of solids (Springer), ISBN 0-387-52681-1.
Mittal, K. L. (1987), Ed., Treatise on Clean Surface Technology, vol. 1 (Plenum), ISBN 0-306-42420-7, Call no. TA 407 T63 1987.
Mykura, H. (1966), Solid Surfaces and Interfaces (Dover).
Park, R. L. and M. G. Lagally (1985), Eds., Solid state physics: surfaces, Methods of experimental physics, v.22 (Orlando, Florida: Acadmic), Call no. QC 176.8 S8 S65 1985.
Ponec, V. and Z. Knor, and Cerny, Slavoj (1974), Adsorption on Solids (CRC PRess), ISBN 0-87819-031-7.
Prutton, M. (1983), Surface Physics, 2nd ed. (Oxford), ISBN 0-19-851863-3 (pb), Call no. QC 176.8 S8.
Rossiter, B. W. and J. F. Hamilton, Eds., Investigations of surfaces and interfaces, Physical methods of chemistry, 2nd ed., vol. 9 (New York: Wiley), Call no. QD61 .P47 1986 v.9.
Vossen, J. L. and W. Kern (1991), Eds., Thin films processes II (Academic), ISBN 0-12-728251-3, Call no. TK 7871.15 F5 T432.
Woodruff, D. P. and T. A. Delchar (1986), Modern Techniques of Surface Science (Cambridge Univ. Press), ISBN 0-521-35719-5 (pb)0, Call no. QC 173.4 S94 W66 1985.
Zangwill, A. (1988), Physics at surfaces (Cambridge Univ. Press), ISBN 0-521-34752-1 (pb), Call no. QC 173.4 S94 Z36.
Carey, F. C. and H. Lee (1988), "Observation of surface states of silicon," AJP 56, 947-8.
Andersen, C. A. (1973), Ed., Microprobe analysis (WIley), ISBN 0-471-02835-5, Call no. QD 98 A48.
Barker, A. S., Jr. (1974), "An optical demonstration of surface plasmons on gold," AJP 42, 1123-1126.
Bauer, S. (1992), "Optical properties of a metal film and its application as an infrared absorber and as a beam splitter," AJP 60, 257-261.
Hilton, J. W. and W. A. Hilton (1973), "Ellipsometric measurements on thermally evaporated thin films," AJP 41, 702-705.
Lafleur, L. D., J. J. Matese, and R. L. Spross (1982), "Time-domain analysis of acoustic transmission by dense thin films," AJP 50, 1031-1035.
Mártil, I. and G. González Diáz (1992), "Undergraduate laboratory experiment: measurement of the complex refractive index and the band gap of a thin film semiconductor," AJP 60, 83-86.
Miller, D. L. and G. I. Moller (1971), "Quantum size effect in polycrystalline bismuth thin films," AJP 39, 567-568.
Mohan, G. K. and V. K. Tondon (1982), "A simple apparatus for metal film deposition," AJP 50, 950-1.
Nestell, J. E., Jr. and R. W. Christy (1971), "Optics of thin metal films," AJP 39, 313-320.
Pray, H. L. (1979), "Dielectic measurements for thin films," AJP 47, 284-285.
Simon, H. J., D. E. Mitchell, and J. G. Watson (1975), "Surface plasmons in silver films - a novel undergraduate experiment," AJP 43, 630-636.
Sparks, P. D. and R. M. Pierce (1988), "Visual observation of a voltage distribution," AJP 56, 513-516.
Swalen, J. D., J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo (1980), "Plasmon surface polariton dispersion relation by direct optical observation," AJP 48, 669-672.
Tabrizi, A. H. (1988), "Design of a profilometer for surface profiling and roughness measurement," AJP 56, 857-8.
Neal, W. E. J. and S. J. Petraitis (1981), "An ellipsometer for student experiments," EJP 2, 69-74.
Steel, G. G. (1970), "The effects of strain on the electrical properties of thin evaporated films of semiconductor compounds," PE 5, 257-261.