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The Bruker Contour Elite 3D optical profilometer employs non-contact white light interferometry (WLI) technology, operating in both Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI) modes. This non-invasive method rapidly measures surface topography with high resolution, accommodating a wide variety of sample types and sizes. It can be used to examine a wide range of samples from 0.05% till 100% reflectivity, flat to rough and slopped surfaces, providing accurate measurements plus high-fidelity imaging. The system generates detailed 3D surface profiles for comprehensive material property analysis. With user-friendly software that simplifies setup and data interpretation, the Contour Elite is an essential tool for precise, efficient surface characterization in both research and industrial environments.
Specifications:
Max. sample size: The stage is 20 cm long, 10 cm wide. It can accept anything that can remain stable on the platform. Up to 10 cm thick.
Max. size of a single scan: ~ 2.9 mm x 2.4 mm, but stitching of multiple images is available.
Magnifications: 5x, 20x and 50x objectives, with integrated 0.55x, 1x and 2x lenses.
Light sources: White and green for VSI; Green for PSI.
Working environment: Air, at room temperature.
Imaging modes:
Vertical Scanning Interferometry (VSI): Best resolution in X-Y is 0.38 μm; resolution in Z is in the nanometer range; max. scanning speed in Z is 47 μm/s.
Phase Shifting Interferometry (PSI): Best resolution in X-Y is 0.38 μm; resolution in Z is in the sub-nanometer range; suitable for samples with <135 nm height difference between pixels.
Fields of applications:
3D optical profilometry, with its high-resolution and non-contact measurement capabilities, is essential in materials science for surface characterization, semiconductor industry for wafer inspection, biomedical engineering for analyzing implants, and manufacturing for quality control and much more across diverse applications.
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