Our AFMs are fully equipped with advanced electrical application packages, enabling a wide range of specialized measurements. These include:

• Conductive AFM (cAFM): Measures the electrical conductivity of a sample with nanometer-scale resolution, useful for analyzing semiconductor devices and thin films.

• Electrostatic Force Microscopy (EFM): Maps electric field gradients above a sample surface, ideal for studying charge distributions and electrostatic interactions.

• Magnetic Force Microscopy (MFM): Visualizes magnetic domains and structures, crucial for investigating magnetic storage media and spintronic devices.

• Piezo Response Microscopy (PFM): Detects piezoelectric and ferroelectric properties, aiding in the development of piezoelectric materials and devices.

• Tunneling AFM (TUNA): Measures ultra-low currents through insulating films, providing insights into the electrical properties of thin dielectric layers.

• Kelvin Probe Force Microscopy (KPFM): Maps surface potential variations with high sensitivity, important for work in photovoltaics and corrosion studies.

• Scanning Capacitance Microscopy (SCM): Profiles doping levels in semiconductors, assisting in the design and optimization of electronic components.

• Scanning Electrochemical Microscopy (SECM): Investigates local electrochemical activity, useful in corrosion research, and the development of batteries and fuel cells.

These advanced modes enable detailed characterisation of material properties, enhancing our ability to support cutting-edge research and development. See examples of our studies below.