The Nanocharacterisation Laboratory is a cutting-edge facility equipped with advanced instruments including four advanced AFMs, two nanoindenters and an optical profilometer. The AFM, as our core instrument, provides high-precision and versatile capabilities, allowing for comprehensive surface characterisation at the nanoscale. The nanoindenter and optical profilometer further extend the capabilities for mechanical and topographical measurements beyond those of the AFM. The nanoindenter extends both the potential applied load and accessible sample size tremendously. This enables more extensive and detailed analyses of material properties. Similarly, the optical profilometer improves imaging speed and extends the accessible region for surface topography measurements. Its non-contact method prevents any sample damage, ensuring the integrity of delicate specimens while providing rapid and comprehensive surface characterisation. This combination of instruments enables comprehensive nanocharacterisation, catering to a wide array of research needs by delivering precise and extensive surface and mechanical property analyses. Please follow the links in the text for more details on each technique and instrument.