Our group uses the Supra 55 extensively, for high-resolution imaging as well as phase, orientation, and chemical analysis. This field-emission SEM provides ~1 nm reresolution using working voltage of 15 kV, and is equipped with an Oxford Instrument Symmetry I EBSD detector and Ultim Max 100 EDS detector. We usually have 2~3 students fully trained on this microscope

NX2000 is a dual-beam FIB-SEM for milling large wafer-like samples efficiently. Unique to other FIB-SEMs, the FIB gun is located perpendicular to the sample surface, providing a geometry for samples with large surface area and better milling efficiency. We usually have two students trained on this FIB-SEM for milling micro-specimen and TEM samples