The scanning electron microscope focuses a beam of electrons onto the surface of a sample to create a scanning image. The electrons in the beam interact with the sample and produce different signals that can be detected by the instrument to obtain information about the composition or topography of the specimen.

Characteristics:

• The CCD image: allows you to locate the sample area or specify analysis positions.

• "Live Analysis Mode", the integrated EDS system displays a real-time EDS spectrum during image observation. The elemental composition or "Alert" for the element of interest is displayed in a live image.

• SOFTWARE: allows you to select and review SEM images and analysis results through the data management area. It can also generate a report.

• MAGNIFICATION: 5X up to 300,000 X

• ELECTRON SOURCE: Thermal (Tungsten)

• ACCELERATION VOLTAGES: 0.3 kV to 30 kV

• VACUUM MODES: Low (10 to 650Pa)-High

• EDS MODES: Spectral analysis, qualitative and quantitative analysis, real time analysis (horizontal/arbitrary line), elemental mapping, spot, etc.

• MEASUREMENT: Distance between points, distance between parallel lines, angle, diameter, etc.

• IMAGE MODES: Secondary electrons (SE), backscattered electrons (BSE) and composition.

• Contact for appointments:

esteban.bermudezurena@ucr.ac.cr