The SEM is a powerful instrument that uses an electron beam to scan and analyse the surface of a sample. This microscope is capable of generating high-resolution images in three dimensions, allowing the topography and structure of the surface to be observed in great detail. In addition, the SEM provides information on the chemical composition of the sample by detecting the electrons backscattered or emitted by the interaction of the electron beam with the sample. This allows analysis of the distribution of chemical elements on the surface and compositional mapping.

AFM, on the other hand, is a microscope that uses an extremely fine and sensitive probe to scan the sample surface at the atomic level. The probe sweeps over the surface and measures the interaction forces between the probe and the sample, providing information on the topography, roughness and mechanical properties of the surface. The AFM is capable of high-resolution imaging, even at the atomic scale, and allows the manipulation and characterisation of nanostructures.

These instruments in the Surface Microscopy Laboratory are used in a wide range of research fields. In materials science, they allow the morphology and structure of materials such as metals, ceramics, polymers and composites to be analysed and understood. In nanotechnology, they are fundamental tools for the characterisation and manipulation of nanostructures and nanomaterials. In biology, they are used to study cells, tissues and biological surfaces at high resolution. They also have applications in environmental science, catalysis, electronics and many other scientific and technological fields.

In short, the Surface Microscopy Laboratory is a specialised space that houses a Scanning Electron Microscope (SEM) and an Atomic Force Microscope (AFM), two key instruments for the detailed study of the surfaces of materials to obtain high-resolution images and characterise the topography, structure and chemical composition of surfaces.