The X-ray diffractometer allows the analysis of the phases of materials, texture analysis, residual stresses in parts, gas reactor chambers and even tomography to obtain 3D models. The system at CICIMA is state-of-the-art with a wide range of applications.

Operating modes:

• X-ray diffraction

• Reflectivity.

• Stress and Texture.

• Measurements in controlled environments.

• Reciprocal Space Mapping

• Microdiffraction

• Tomography

• SAXS/WAXS

• GISAXS

• Pair distribution function (PDF)

Applications in areas of study such as: 

Materials Science, Pharmaceutical, Geoscience, Archaeology, Polymers, Thin Films and Coatings, Semiconductors and Photovoltaics, Dentistry and Chemistry.

• Contacts for appointments:

fabian.vasquezsancho@ucr.ac.cr

esteban.avendanosoto@ucr.ac.cr