The atomic force microscope can detect forces at the atomic level, generating images of very small structures. It is also capable of obtaining maps due to electrical, magnetic or adhesion forces. This is why it is a very important piece of equipment for characterising materials.

It has important applications in fields such as:

• Materials science

• Pharmaceutical

• Geoscience

• Archaeology

• Meteorology

• Polymers and thin films or coatings

• Semiconductors and photovoltaics

• Forensic sciences

• Statistics

• Chemistry

• Bioinformatics

• Dentistry

Operation Modes:

• Atomic force topographic imaging in contact mode.

• Atomic force topographic images in tapping mode.

• Atomic force topographic images in peak force tapping mode.

• Atomic force topographic images in scanasyst mode.

• Atomic force topographic imaging in peakforce QNM mode.

• peakforce atomic force topographic imaging in peakforce mode TUNA

• magnetic force topographic imaging.

• Acquisition of single-point force curves. 

• Imaging of surfaces in contact with liquid phase.

• Electrochemical mode imaging.

• Contact for appointments:

esteban.avendanosoto@ucr.ac.cr