Lectures & seminars

Conference tutorials:

• IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021: "Faster fault isolation with advanced data analysis and computer vision"

• Hamamatsu Workshop 2014: "Advanced applications of time-integrated and time-resolved emission for circuit testing and failure analysis"

• European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) 2006: "PICA technique"

Company seminars and training:

• DCG Systems, Fremont, CA, USA (2013): "Recent Developments in .Time-Resolved Emission Measurements"

• Schlumberger, San Jose, CA, USA (2002): "Hot-carrier luminescence single-photon detection for IC testing"

• STMicroelectronics R&D, Agrate Brianza, Italy (2000): "Analog and Digital Testing of CMOS Circuits by Means of an Optical Technique"

• STMicroelectronics R&D, Agrate Brianza, Italy (1998): "A new modular approach to the interconnection line capacitance evaluation"

University lectures:

• Politecnico di Milano - Department of Electronics and Information Science, Milan, Italy (2002): "Non-invasive wide-bandwidth analysis of integrated CMOS circuits with ultra-sensitive photodetectors"

• Politecnico di Milano - Course of Electronic Measurements and Instrumentation, Milan, Italy (2002): "CCD photodetectors: principle of operation, electronics, specification and applications"

• Politecnico di Milano - Course of Electronic Measurements and Instrumentation, Milan, Italy (2002): "Lock-in amplifiers: LIA versus LID"

• Politecnico di Milano - Department of Electronics and Information Science, Milan, Italy (2001): "Dynamic Internal Testing of CMOS Circuits Using Hot-Carrier Luminescence"

• Politecnico di Milano - Department of Electronics and Information Science, Milan, Italy (2001): "Static and Dynamic Optical Measurements on New Generation Test Chip"

• Politecnico di Milano - Department of Electronics and Information Science, Milan, Italy (2001): "Wide-Bandwidth Contactless Testing of Signals in ULSI Circuits by means of Ultrafast Photon-Detectors"

• Politecnico di Milano - Department of Electronics and Information Science, Milan, Italy (2000): "Dynamic Internal Testing of CMOS Circuits Using Hot-Carrier Luminescence"

• Politecnico di Milano - Course of Electronic Measurements and Instrumentation, Milan, Italy (1999): "Testing of CMOS Circuits by Detection of Hot-Carrier Luminescence"

• Politecnico di Milano - Course of Optoelectronics, Milan, Italy (1999): "Testing of CMOS Circuits by Detection of Hot-Carrier Luminescence"