Member of the Executive Committee of the NY/NJ Metro Chapert of ASM International since 2022
Fellow ASM International since 2022
The honor of Fellow represents recognition of your distinguished contributions in the field of materials science and engineering and develops a broadly based forum for technical and professional leaders to serve as advisors to the Society. The award citation reads: "For sustained and outstanding contributions to the development and application of novel techniques to the testing, fault diagnosis, and failure analysis of semiconductor devices."
Senior Member IEEE (Institute of Electrical and Electronics Engineers) since 2006 (previously M. '04, S.M. '95).
Senior Members are an elite group in IEEE: only 7.6% of the approximately 367,000 members hold this grade, which requires experience, reflecting professional maturity and significant professional achievements.
EDFAS (Electronic Device Failure Analysis Society) since 2003.
GEI (Italian Electronics Group) from 1998 to 2002.
Reviewer of manuscripts for:
IEEE Electron Device Letters (EDL)
Transactions of The Society for Modeling and Simulation International (SCS) from 2000 to 2002.
Member of technical committees:
“Optical techniques” session at the International Symposium on Test and Failure Analysis (ISTFA) 2007, 2008
"Failure analysis" session at the International Reliability Physiscs Symposium (IRPS) 2007
“Optical techniques” session at the International Symposium on Test and Failure Analysis (ISTFA) 2006
Interviews of candidates for hire at IBM Research, Yorktown Heights, NY since 2003, for Postdoc and Research Staff Member positions.