Recommendation letters are available upon request from the following people:
- Dr. Mike Bruce, Advanced Micro Devices, Inc. (AMD), Austin, TX
scientist at Advanced Micro Devices (AMD), with over 16 years of
experience, has published over 25 technical papers and 50 patents in the
...His early papers on "time resolved
luminescence" of CMOS IC's showed a much improved way to acquire the
signal. Already at that time he was quickly becoming one of the leading
researchers in the application of photon (light) emission based
diagnostics to semiconductor microelectronics. His research into hot
carrier emission and new photo- detectors has helped to make PICA one of
the industry's leading debug techniques for ICs...
presentations were always outstanding. One of his most resent
presentations at the IRPS that I chaired this year was particularly
enlightening for me as he showed how to measure signal switching time
using PICA. Dr. Stellari continues to greatly expand the
state-of-the-art in photon emission based diagnostics. His efforts have
been recognized through many well deserved awards for best papers at
conferences and journal publications...
...Dr. Stellari is
recognized as one of the main experts at IBM. His sharing of his
knowledge has helped us understand and improve our own capabilities.
This translates into getting product to market faster and makes us more
- Dr. Mauro Ciappa, Integrated Systems Laboratory - ETH - Swiss Federal Institute of Tecnology, Zurich, CH
- Prof. Sergio Cova, Department of Electronics and Information - Politecnico di Milano, Milan, Italy
Professor of Electronics and Head of the Electronics Section of the
Department of Electronics and Information Technology at Politecnico di
Milano, a Life Fellow of IEEE, and a Distinguished Lecturer of the IEEE
Laser and Electro Optical Society, with more than 30 years of experience
and an established track record of over 180 technical papers in
microelectronic science and technology.
was a brilliant student at this University and attended my course on
Electronic Instrumentation and Measurements. His results ranked him in
the top 1% of all students and he attained a summa-cum-laude graduation
in the minimal time foreseen by the curriculum, carrying out a brilliant
...(during his PhD) Franco
Stellari quickly absorbed the know-how developed in our laboratory on
detectors and optoelectronic instrumentation and gained a good insight
in the problems to be tackled. He soon gave very significant personal
contributions in a diversified research activity, which required
accurate analysis of physical problems, skillful design of electronic
and optical instrumentation and painstaking experimental work. His
activity produced publications in international refereed journals and
one of the best Ph.D thesis works that I have supervised...
- Dr. R. Aaron Falk, OptoMetrix Inc. , Renton, WA
President and founder of OptoMetrix Inc.
with Dr. Stellari's basic scientific credentials should be a valuable
addition to our nation's technical community. I can add from personal
knowledge and experience that Dr. Stellari has made critical
contributions in the area that drives our current computer based
economy. I can also vouch for his personal integrity. He would be an
asset to any company working in this field, including OptoMetrix...
- Prof. Andrea L. Lacaita, Department of Electronics and Information - Politecnico di Milano, Milan, Italy
of the Microelectronics Lab at Politecnico di Milano, with more than 10
years of experience and an established track record of over 200
... I first
met Dr. Franca Stellari in Nov. '97, when I selected him among my best
students for working on the refinement of the analytical formulas
employed in circuit simulators to estimate interconnect capacitances. In
his university curriculum Dr. Franco Stellari attended twenty nine
courses in Electronics, Physics, Math, and Optoelectronics at our
University. He obtained extremely good results, reaching an average
score of 29.9/30, ranking him in the top 1% of the students at
Politecnico di Milano...
was very impressed by his command of both theoretical and experimental
techniques. In a very short time (two months) and without prior
experience in this area he was able to master the confocal mapping
methods and contributing to the characterization of integrated test
structures. Dr. Franco Stellari developed new compact formulas for
interconnect capacitances in submicron technologies and the major
results of his thesis work have been published in IEEE Trans. Electron
Dev., 47, 222-231 (2000). Thanks to the wide acceptance of this paper,
he became a reviewer of several papers on similar topics submitted to
the IEEE Electron Dev. Lett. journal in the following years...
- Dr. William K. Lo, Diagnostics and Characterization Group - Credence Corp., Sunnyvale, CA
Group Manager at Credence, Design and Characterization Group, with over
10 years of experience in developing specialized failure analysis
instruments for semiconductor device manufacturers (Schlumberger,
NPTest, and Credence).
Stellari is an expert on Picosecond Integrated/Imaging Circuit Analysis
(PICA) one of the most important tools in an integrated circuit (IC)
designer's arsenal. PICA is a technique to passively probe internal
transistors in integrated circuit (IC) devices by analyzing the
spontaneous time-dependent light emissions from the transistors...
Stellari has made several valuable contributions to the field including
devising a model of the light emission process which allows PICA users
to better determine the nature of the faults in their ICs, and making
detailed measurements of light emission as a function of IC operating
voltage and feature size which allows users and tool manufacturers to
predict the useful lifetime of the PICA technique. For tool developers,
the former allows us to better demonstrate the value of PICA to new
users while the latter gives us an idea of when new tools and techniques
may be required and, hence, when and at what level to start investing
in their development...
...It was immediately apparent to me that
he had an exceptional understanding of both the theoretical and
practical aspects of his work. He was able to explain the mechanisms
leading to low jitter and high dark count rates in his detector and how
those parameters affected the performance of the detector when used in a
PICA system. In my experience, it is very rare to find people who can
- Dr. Steven Kasapi, Diagnostics and Characterization Group - Credence Corp., Sunnyvale, CA
- Dr. Modest M. Oprysko, IBM System & Technology Group, Yorktown Heights, NY
Technical Advisor in IBM's Systems and Technology Group with more than
20 years of experience in Communications and High-Speed Test, confirms
Dr. Stellari's exceptional accomplishments and pioneering research in
the field of optical emissions based testing and diagnostics of highly
makes Dr. Stellari so special and important to IBM is that he possesses
the rare combination of deep theoretical skills and understanding of the
practical & commercial issues in his field of expertise. These
skills are extraordinarily difficult to find...
the four years he has been with IBM, Dr. Stellari has made outstanding
contributions in the field of optical emissions based testing and
diagnostics of highly integrated circuits...
...Dr. Stellari has
established himself as a leading researcher in the field, whose work not
only significantly contributes to IBM products but also the
competitiveness of the US industry as a whole. Dr. Stellari's
outstanding contributions have been recognized by both IBM and the
- Dr. Philippe Perdu, VLSI Failure Analysis Laboratory - French Space Agency (CNES), Thales, France
and manager of VLSI Circuits Failure at CNES Laboratories, the French
National space Agency, with more than 17 years of experience and an
established track record of over 100 technical papers in the fields of
defect localization and internal contactless testing of VLSI Circuits.
first met Dr. Franco Stellari in September 2002 when we attended the
2002 European Symposium on Reliability of Electron Devices (ESREF) in
Rimini, Italy. Dr. Franco Stellari presented a paper entitled "Optical
diagnosis of excess IDDQ in low power CMOS circuits". This paper won the
Best Paper Award of the conference by clearly demonstrating that the
PICA technique could be extended to use Off-State Leakage current to
diagnose failures in advanced CMOS chips. This work was very important,
not only because he proved the ability to use PICA for this kind of
challenging problems, but also because this work drastically reduced the
time to market delay for the IBM product...
had the opportunity to meet Dr. Franco Stellari once again in November
2002 when we attended the 2002 ISTFA in Phoenix, AZ. Dr. Franco Stellari
presented a paper entitled "Circuit voltage probe based on time-
integrated measurements of optical emission from leakage current". In
this paper he showed for the first time that internal Vdd levels can be
probed inside ICs by means of the PICA technique. At this occasion, Dr.
Franco Stellari demonstrated through the content of this publication and
through his meaningful and precise answers to the attendee's questions a
unique ability to merge his high scientific knowledge with VLSI
circuits manufacturer challenges.
met Dr. Franco Stellari again in October 2003 when we attended the 2003
ESREF at Acachon, France. He had 3 papers at the conference and he
presented a paper entitled "Latchup Analysis using Emission Microscopy".
By this time Dr. Franco Stellari was the reference IBM person for the
collaborations between CNES and IBM. In this occasion various meeting
were held to discuss research collaboration and strategies. Moreover Dr.
Franco Stellari organized the evaluation of a silicon APD detector
manufactured by PoliMi at the CNES research center.......
have known Dr. Franco Stellari for three years and I have closely
followed his work on Time Resolved Emission since his first paper.
Driven by innovative and productive research effort, Dr. Franco Stellari
has been well and deeply involved in the field of internal contactless
testing of VLSI. He exhibits a solid understanding in all the field
related to dynamic photo-emission He is definitely a top-rated
researcher. Dr. Franco Stellari has established a worldwide reputation
on Time Resolved Emission and its applications. In my opinion, Dr.
Franco Stellari's work in this aspect can be classified as research with
top quality in the world. His papers are becoming more and more a
reference for everybody who is dealing with dynamic emission
- Dr. Peilin Song, IBM T.J. Watson Research Center, Yorktown Heights, NY
- Dr. Loris Vendrame, Central R&D - STMicroelectronics, Agrate Brianza, Italy
and Development Staff Member at STMicroelectronics responsible for
back-end and analogue characterization of stand-alone and embedded
Non-Volatile Memory technologies.
...I enjoyed his ability to struggle and to solve all the experimental difficulties that were arising while managing the tests. Moreover I was impressed by both his deep theoretical knowledge (not common in researcher deeply involved in experimental tools) and by his flexibility to stay longer than the normal working time to allow myself to share part of the day between STM and Politecnico...
- Prof. Franco Zappa, Department of Electronics and Information - Politecnico di Milano, Milan, Italy
Professor of Electronics at Politecnico di Milano, Milan, Italy, with
more than 10 year experience, more than 80 international papers and
several patents; and co-founder of Micro Photon Devices, spin-off company specialized in the development and production of detection modules for single-photon counting and timing.
...I noticed his enthusiastic push devoted to actively pursuing the research goals...
very much appreciated his skills in conceiving research activities,
arranging experiments, and educe analytical modelings from lucid
interpretations of results. Indeed he is a very enthusiastic and
...Franco has a bright natural attitude,
is a good worker, and has very smart personality, easy to get along and
collaborate with. It is on the basis of all the above that I strongly
recommend the candidate as a scientist of World class experience and
ability who has and will continue to make excellent contributions to
research in microelectronics and to the development of advanced
- Prof. Tian Xia, Department of Electrical and Computer Engineering - University of Vermont, Vermont, VT
Professor of Electrical and Computer Engineering department at the
University of Vermont, a member of IEEE and Sigma Xi Honor Society, with
more than 10 years of experience in the field of Electronic
Engineering, specifically related to test challenges in high-speed mixed
signal and RF circuits.
was able to appreciate his deep understanding of both device physics and
circuit layout, as well as his lab skills with instrumentation and data
analysis software. Dr. Franco Stellari was also very effective in
applying his research to tackle real problems arising with novel IBM
chips, drastically reducing the time to market delay for the IBM
known Dr. Franco Stellari for four years; I have closely worked with him
on several occasions and followed his work on new and advanced
techniques for testing VLSI chips. He has a solid understanding of
device physics, CMOS circuits and time-resolved optical emission that he
combines with his instrument and software skills to effectively and
successfully develop new testing techniques for IBM microprocessor