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Papers in international journals and magazines:

Invited papers in international journals and magazines:

  • P. Song, S. Polonsky, F. Stellari, K. Jenkins, A.J. Weger, T. Xia, and S. Cho, “CMOS IC diagnostics using the Light Emission from Off-state Leakage Currents”, Electronic Device Failure Analysis (EDFA), vol. 7, no. 3, Aug. 2005, pp. 12-19.
  • F. Stellari, P. Song, A. Weger, M.K. McManus, R. Gauthier, and P. Sanda, “Electrical and optical characterization of latchup”, Microelectronic Failure Analysis Desk Reference (MFADR), 2004, pp. 174-192.
  • F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K.V. Chatty, M. Muhammad, and P. Sanda, “Analysis of factors impacting latchup in I/O interface circuits using a combined optical and electrical testing method”, Electronic Device Failure Analysis (EDFA), vol. 6, no. 3, Aug. 2004, pp. 20-29.

Invited papers at international conferences:

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Last update on 2014-06-24