Publications

See also Google Scholar results

Papers in international journals and magazines:

1. F. Stellari, E.Y. Wu, L. Ocola, T. Ando, and P. Song, "Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells", Microelectronics Reliability, vol. 146, July 2023, 114982, doi: 10.1016/j.microrel.2023.114982.

2. E.Y. Wu, F. Stellari, L. Ocola,  M. Frank,  P. Song, and  T. Ando, "Gibbs spatial process for characterization of filament interaction in ReRAM devices via photon emission microscopy",  Appl. Phys. Lett., no. 120, 2022, p. 132902, doi: 10.1063/5.0086202.

3. F. Stellari, E.Y. Wu, T. Ando, E. Cartier, M.M. Frank, C. Cabral, P. Song, and D. Pfeiffer, "Resistive Random Access Memory Filament Visualization and Characterization using Photon Emission Microscopy", IEEE Electron Dev. Lett. (EDL), vol. 42, no, 6, 2021, pp. 828-831, doi: 10.1109/LED.2021.3071168 (June 2021 Editors' pick and featured on printed edition magazine cover).

4. C. Cabral Jr, R. Laibowitz, F. Stellari, and P. Song, "AC conductivity analysis as a measure of low k dielectric capacitor reliability degradation due to moisture ingress",  Microelectronic Engineering, 223, 2020, 111214.

5. F. Stellari, K.A. Jenkins, A.J. Weger, B. Linder, and P. Song, "Self-Heating Measurement of 14 nm FinFET SOI Transistors using 2D Time-Resolved Emission", IEEE Trans. on Electron Dev., vol. PP,  no. 9, March 2016, pp. 1-7.

6. F. Stellari, P. Song, and A.J. Weger, "Single Photon Detectors for Ultra Low Voltage Time Resolved Emission Measurements", IEEE J. on Quantum Electronics, vol. 47, no. 6, 2011, pp 841-848.

7. M. Meterelliyoz, P. Song, F. Stellari, J.P. Kulkarni, and K. Roy, "Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor", IEEE Trans. on Circuits and Systems I, no. 99, 2010, pp. 1-10.

8. B.L. Ji, D.J. Pearson, I. Lauer, F. Stellari, D.J. Frank, L. Chang, and M.B. Ketchen, “Operational amplifier based test structure for transistor threshold voltage variation”, IEEE Trans. on Semiconductor Manufacturing, vol. 22, no. 1, 2009, pp. 51-58.

9. A. Tosi, F. Stellari, F. Zappa, and P. Song, “A packaging solution for optically testing wire-bonded chips”, IEEE Trans. on Advanced Packaging, vol. 31, no. 3, 2008, pp. 490-495.

10. F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Testing and diagnostics of CMOS circuits using Light Emission from Off-State Leakage Current”, IEEE Trans. on Electron Devices, vol. 51, no. 9, 2004, pp. 1455-1462 (2004 IEEE-EDS Paul Rappaport Award).

11. F. Stellari, A. Tosi, F. Zappa, and S. Cova, “CMOS circuit testing via tme-resolved luminescence measurements and simulations”, IEEE Trans. on Instrumentation and Measurement, vol. 53, no. 1, 2004, pp. 163-169.

12. F. Stellari, F. Zappa, S. Cova, C. Porta, and J.C. Tsang, “High-speed CMOS circuit testing by 50ps time-resolved luminescence measurements”, IEEE Trans. on Electron Devices, vol. 48, no. 12, Dec. 2001, pp. 2830-2835.

13. F. Stellari, F. Zappa, S. Cova, and L. Vendrame, “Tools for contactless testing and simulation of CMOS circuits”, Microelectronic Reliability, vol. 41, no. 11, Nov. 2001, pp. 1801-1808.

14. F. Stellari and A.L. Lacaita, “New formulas of interconnect capacitances based on results of conformal mapping method”, IEEE Trans. on Electron Devices, vol. 47, no. 1, Jan. 2000, pp. 222-231.

Invited papers in international journals and magazines:

1. A. Bahgat Shehata, F. Stellari, and P. Song, "Superconducting Single Photon Detector Brings Back Light to Time-Resolved Emission Testing of ICs", Electronic Device Failure Analysis (EDFA) Magazine, vol. 18 no. 4, 2016, pp.16-22.

2. F. Stellari, C-C Lin, and P. Song, "Automated high-resolution imaging of very large fields of view (FOV)", Electronic Device Failure Analysis (EDFA) Magazine, vol. 17. no. 3, Aug. 2015, pp. 12-19.

3. P. Song, S. Polonsky, F. Stellari, K. Jenkins, A.J. Weger, T. Xia, and S. Cho, “CMOS IC diagnostics using the Light Emission from Off-state Leakage Currents”, Electronic Device Failure Analysis (EDFA) Magazine, vol. 7, no. 3, Aug. 2005, pp. 12-19.

4. F. Stellari, P. Song, A. Weger, M.K. McManus, R. Gauthier, and P. Sanda, “Electrical and optical characterization of latchup”, Microelectronic Failure Analysis Desk Reference (MFADR), 2004, pp. 174-192.

5. F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K.V. Chatty, M. Muhammad, and P. Sanda, “Analysis of factors impacting latchup in I/O interface circuits using a combined optical and electrical testing method”, Electronic Device Failure Analysis (EDFA) Magazine, vol. 6, no. 3, Aug. 2004, pp. 20-29.

Invited papers at international conferences:

1. F. Stellari, "Faster fault isolation with advanced data analysis and computer vision", China Semiconductor Technology International Conference (CSTIC), Shanghai, China, March 2022.

2. F. Stellari, Chung-Ching Lin, Fei Lan, and Peilin Song, "Tool automation and computer vision methodologies for faster IC diagnostics", IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2021.

3. F. Stellari, A. Bahgat Shehata, and P. Song, "1D and 2D time-resolved emission measurements of circuits Fabricated in 14 nm Technology Node", IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2020.

4. F. Stellari, A.J. Weger, G. La Rosa, K.A. Jenkins, B. Linder, and P. Song, "Estimating transistor channel temperature using time-resolved and time-integrated NIR photoemission", International Reliability Physics Symposium (IRPS), San Francisco, 2018.

5. L.M. Gignac, C. Beslin, J. Gonsalves, F. Stellari, and C.-C. Lin, "High energy BSE/SE/STEM imaging of 8 um thick semiconductor interconnects", Microscopy & Microanalysis, 2014.

6. F. Stellari and P. Song, “Testing of Ultra Low Voltage CMOS Microprocessors using the Superconducting Single-Photon Detector (SSPD)”, International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, June 27-July 1, 2005, p. 2.

7. P. Song, F. Stellari, and M.K. McManus, “Time-Resolved Emission Testing Challenges for Low Voltage CMOS Technologies”, Laser and Electro-Optics Society (LEOS), Tucson, Arizona, Oct. 26-30, 2003, pp. 596-597.

8. P. Song, F. Stellari, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Testing of Low Power CMOS Circuits using Optical Emission from Leakage Current”, International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, July 7-11, 2003.

Papers presented at international conferences:

1. G. Cohen, P. Kerns, L. Ocola, N. Marchack, J. Bruley, F. Stellari, D. Rath, C. Lavoie, and C-T Chen, "Highly textured (100)-oriented and (111)-oriented, cobalt mono silicide nanoribbons: material growth and device fabrication", Material Research Society (MSR), Sprint Meeting, 2024.

2. F. Stellari and P. Song, "Reliability study of 14 nm scan chains and its application to hardware security", Int. Test Conf. (ITC), 2022.

3. F. Stellari, E.Y. Wu, M.M. Frank, L.E. Ocola, T. Ando, and P. Song, "Filament localization and characterization in HfO2 ReRAM cells using laser stimulation", European Solid-State Device Research Conference (ESSDERC), Milan, Italy 2022.

4. F. Stellari, L.E. Ocola, E.Y. Wu, T. Ando, and P. Song, "Photon emission microscopy of amorphous HfO2 ReRAM cells", IEEE Int. Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), July 2022.

5. E. Wu, F. Stellari, T. Ando, P. Song, and M. Frank, "Development  of spatial nearest-neighbor analysis and Clustering/Gibbs statistical methodology for filament percolation in dielectric breakdown and forming process in ReRAM devices", IEEE International Electron Devices Meeting (IEDM), 2021.

6. F. Stellari, E.Y. Wu, T. Ando, M.M. Frank, and P. Song, "Photon Emission Microscopy of HfO2 ReRAM Cells", International Symposium for Testing and Failure Analysis (ISTFA), 2021.

7. F. Stellari, C. Cabral, P. Song, and R. Laibowitz, "Humidity penetration impact on integrated circuit performance and reliability", IEEE International Electron Devices Meeting (IEDM), 2019, doi: 10.1109/IEDM19573.2019.8993601.

8. F. Stellari, P. Song, Y. Iwaki, S. Kim, and M. Villalobos, "Time-resolved imaging of VLSI circuits using a single-point single-photon detector and a scanning head", International Symposium for Testing and Failure Analysis (ISTFA), 2019, pp. 60-67, doi: istfa2019p0060.

9. U. Srinivasan, W. Huott, C. Adams, P. Freiburger, F. Stellari, P. Song, P. Tran, and D. Albert, "Case study of advanced diagnostic techniques for multi port register file", IEEE North Atlantic Test Workshop (NATW), 2019, doi: 10.1109/NATW.2019.8758709.

10. A.L. Crouch, P. Levin, J. Dworak, L. Ramakrishnan, Y. Xia, C. Zhang, D. Engels, G. Evans, P. Gui, S. McWilliams, F. Stellari, N. Wang, P. Song, "Innovate practices on cyber security of hardware semiconductor devices",  IEEE VLSI Test Symposium (VTS), 2019, doi: 10.1109/VTS.2019.8758665.

11. F. Stellari, C-C Lin, T. Wassick, T. Shaw, and P. Song, "Automated Contactless Defect Analysis Technique using Computer Vision", International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, 2018, pp. 73-79.

12. F. Stellari, N. Wang, and P. Song, "Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress", European Solid-State Device Research Conference (ESSDERC), Dresden, Germany, 2018, pp. 250-253.

13. A.J. Weger, F. Stellari, and P. Song, "Device Channel Temperature Measurement Using NIR Emission", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Pasadeba, CA, 2017.

14. F. Stellari and P. Song, "Automated emission data registration and segmentation for IC analysis", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Fort Worth, TX, 2016.

15. F. Lan , F. Stellari, A. Bahgat Shehata and P. Song, "Extending the resolution of emission images beyond diffraction limits using deconvolution" Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Fort Worth, TX, 2016.

16. F. Stellari, P. Song, M. Villalobos, and J. Sylvestri, "Revealing SRAM Memory Content using Spontaneous Photon Emission", VLSI Test Symp. (VTS), 2016, pp. 1-6.

17. F. Stellari, A. Ruggeri, A. Bahgat Shehata, H. Ainspan, and P. Song, "Spontaneous photon emission from 32 nm and 14 nm SOI FETs", Int. Reliab. Phys. Symp. (IRPS), 2016.

18. A. Bahgat-Shehata, F. Stellari, A. Weger, P. Song, I. Yoshii, H. Deslandes, T. Lundquist, and E. Ramsay, "Extended sensitivity NIR camera for photon emission microscopy of ICs", NANO Testing Symposium, Toyonaka, Japan, 2015.

19. F. Stellari, C-C Lin, L. Gignac, R. Robertazzi, A. Weger, and P. Song, "Techniques for Reverse Engineering and Functionality Extraction of Mixed-Signal ICs for Security Applications", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Portland, OR, 2015.

20. L.M. Gignac, C.M. Breslin, J. Gonsalves, F. Stellari, and C.-C. Lin, "Very High Energy (300-400 keV) SEM imaging of Cu Interconnects", Scanning Microscopies, 2015

21. A. Bahgat Shehata, A. Ruggeri, F. Stellari, A.J. Weger, P. Song, and V. Anant, "Effect of Temperature on Superconducting Nanowire Single-Photon Detector Noise", SPIE Optics + Photonics, San Diego, CA, 2015.

22. F. Stellari, K.A. Jenkins, A.J. Weger, B. Linder, and P. Song, "Self-Heating Characterization of FinFET SOI Devices using 2D Time Resolved Emission Measurements", Proc. of International Symposium on Physics and Reliability (IRPS), Monterey, CA, 2015.

23. A. Bahgat Shehata, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and E. Ramsay, "Time Integrated Photon Emission as a Function of Temperature in 32 nm CMOS", Proc. of International Symposium on Physics and Reliability (IRPS), Monterey, CA, 2015.

24. A. Bahgat Shehata and F. Stellari, "Tuning of Superconducting Nanowire Single Photon Detector parameters for VLSI circuit testing using Time Resolved Emission", SPIE Photonic West Opto, San Francisco, CA, 2015.

25. C-C Lin and F. Stellari, "Automated Mapping of Very Large Areas of VLSI Circuit using SIL", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. 12-18.

26. A. Bahgat Shehata, F. Stellari, A. Weger, P. Song, H. Deslandes, E. Ramsay, and T. Lundquist, "Novel NIR camera with extended sensitivity and low noise for photon emission microscopy of VLSI circuits",Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. 6-11.

27. A. Bahgat Shehata, F. Stellari, A.J. Weger, and P. Song, "Modeling of Transient and Static Components of Intrinsic Emission from VLSI Circuits", Proc. of International Symposium on Physics and Reliability (IRPS), Waikoloa, HI, 2014, pp. 4A.1.1-4A.1.7.

28. F. Stellari, P. Song, A.J. Weger, J. Culp, A. Herbert, and D. Pfeiffer, "Verification of Untrusted Chips using Trusted Layout and Emission Measurements", IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), Arlington, VA, 2014, pp. 19-24.

29. F. Stellari, P. Song, and H.A. Ainspan, "Functional Block Extraction for Hardware Security Detection using Time-Integrated and Time-Resolved Emission Measurements", Proc. VLSI Test Symposium (VTS), Napa, CA, 2014, pp. 1-6.

30. E. Ramsay, H. Deslandes, T. Lundquist, K. Sunter, K. Berggren, V. Anant, U. Kindereit, A. Baghat Shehata, F. Stellari, A.J. Weger, and P. Song, "Logic Analysis Tool", Government Microcircuit Applications & Critical Technology Conference (GOMACTECH), Charleston, SC, March 31- April 3, 2014.

31. A.J. Weger, F. Stellari, S. Kim, H.A. Ainspan, Y. Kwark, C.W. Bak, D. Maliuk and P. Song, "32nm CMOS SOI Test Site for Emission Tool Evaluation", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013.

32. C.C. Lin, F. Stellari, L. Gignac, P. Song, and J. Bruley, "Automatic Registering and Stitching of TEM/STEM Image Mosaics", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013.

33. F. Stellari, P. Song, A.J. Weger, D. Maliuk, H.A. Ainspan, S.Kim, Y. Kwark, and C.W. Baks, "Tester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurements", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013.

34. F. Stellari, A.J. Weger, S. Kim, D. Maliuk, P. Song, H.A. Ainspan, Y. Kwark, C.W. Baks, U. Kindereit, V. Anant, and T. Lundquist, "Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of VLSI Circuits", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013, pp. 182-188.

35. F. Stellari and P. Song, "Advanced methods and software for enhancing analytical tools capabilities during chip diagnostic and characterization", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, 2012.

36. U. Kindereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni, "Comparison of Near-Infrared Photon Emission Spectroscopy of a 45 nm and 32 nm SOI Ring Oscillators", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, 2012.

37. Ji. Chen, P. Song, T. Shaw, F. Stellari, L. Gignac, C. Breslin, D. Pfeiffer, and G. Bonila, "A Novel Integrated Reliability Test System for BEOL TDDB Study", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, 2012.

38. F. Stellari, T. Cowell, P. Song, M. Sorna, Z. Toprak-Deniz, J.F. Bulzacchelli, and N.A. Mitra, "Root cause identification of an hard-to-find on-chip power supply coupling fail",  Proc. of International Test Conference (ITC), Anaheim, CA, 2012.

39. P. Song and F. Stellari, "Tester-Based Optical and Electrical Diagnostic System and Techniques", Proc. of VLSI Test Symposium (VTS), Maui, Hawai 2012.

40. U. Kindereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni, "Near-infrared Photon Emission Spectroscopy of a 45 nm SOI Ring Oscillator", Proc. of International Symposium on Physics and Reliability (IRPS), Anaheim, CA, 2012.

41. F. Stellari, P. Song, A.J. Weger, T. Nakamura, S. Kim, and R. Roche, "A Position Sensitive Single Photon Detector with Enhanced NIR Response", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose (CA), 2011.

42. P. Song, F. Stellari, A. Weger, D. Phiper, "MARVEL - Malicious Alteration Recognition and Verification by Emission of Light", IEEE Int. Symp. on Hardware-Oriented Security and Trust (HOST), San Diego, CA, 2011, pp. 117-121.

43. K. Stawiasz, K.A. Jenkins, P. Song, F. Stellari, J. Tierno, A. Rylyakov, and D. Friedman, "Characterization of the Digital PLLs on an 8-Core Microprocessor Using Electrical and Optical Techniques", IEEE VLSI Test Symposium (VTS), Dana Point, CA, 2011.

44. F. Stellari, P. Song, and A.J. Weger, "Single-photon detectors for ultra-low-voltage time-resolved emission measurements of VLSI circuits", SPIE Defense, Security & Sensing - Advanced Photon Counting Techniques V, Orlando, FL, 2011.

45. F. Stellari, S.E. Steen, K.C. Fisher, and X. Shao, "Photovoltaic (PV) cells characterization using advanced optical tools", Proc. of International Symposium on Physics and Reliability (IRPS), Anaheim, CA, 2010.

46. F. Stellari, P. Song, J. Sylvestri, D. Miles, O. Forlenza, and D. Forlenza, "On-Chip Power Supply Noise Measurement using Time Resolved Emission (TRE) Waveforms of Light Emission from Off-State Leakage Current (LEOSLC)", Proc. of International Test Conference (ITC), Austin, TX, 2009, pp. 1-10.

47. F. Stellari, P. Song, A.J. Weger, and D.L. Miles, "Mapping Systematic and Random Process Variations using Light Emission from Off-State Leakage", Proc. of International Symposium on Physics and Reliability (IRPS), Montreal, Canada, 2009, pp. 640-649.

48. F. Stellari, P. Song, J. Vickers, C. Shaw, S. Kasapi, and R. Ispasoiu, “Evaluating PICA capability for future low voltage SOI chips”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Portland (OR), 2008, pp. 407-416. 

49. P. Song, S. Ippolito, F. Stellari, J. Sylvestri, T. Diemoz, G. Smith, P. Muench, N. James, S. Kim, and H. Saenz, “Optical Diagnostics for IBM POWER6TM Microprocessor”, Proc. of International Test Conference (ITC), Santa Clara, (CA), 2008.

50. M. Meterelliyoz, P. Song, F. Stellari, J.P. Kulkarni, and K. Roy, “A High Sensitivity Process Variation Sensor Utilizing Sub-threshold Operation”, Proc. Custom Integrated Circuits Conference (CICC), San Jose, CA, 2008.

51. B.L. Ji, D.J. Pearson, I. Lauer, L. Chang, F. Stellari, M.B. Ketchen, “Operational Amplifier Based Test Structure for Transistor Threshold Voltage Variation”, Proc. International Conference on Microelectronic Test Structures (ICMTS), Edinburgh, Scotland, 2008, pp. 3-7. 

52. F. Stellari, P. Song, T.E. Diemoz, A.J. Weger, T. Vogel, S.C. Wilson, J. Pennings, and R.F. Rizzolo, “High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images”, Proc. of International Test Conference, (ITC), San Jose, CA, 2006, pp. 1-10.

53. F. Stellari, A. Tosi, and P. Song, “Switching Time Extraction of CMOS Gates using Time-Resolved Emission (TRE)”, Proc. of International Symposium on Physics and Reliability (IRPS), San Jose, CA, 2006, pp. 566-573.

54. A. Tosi, F. Stellari, A. Pigozzi, G. Marchesi, and F. Zappa, “Characterization of backside hot-carrier luminescence in scaled CMOS technologies”, Proc. of International Symposium on Physics and Reliability (IRPS), San Jose, CA, 2006, pp 595-601.

55. P. Song, F. Stellari, B. Huott, O. Wagner, U. Srinivasan, Y. Chan, R. Rizzolo, H.J. Nam, J. Eckhardt, T. McNamara, C-L Tong, S. Wilson, A.J. Weger, and M.K. McManus, “An Advanced Optical Diagnostic Technique for IBM Microprocessor”, Proc. of International Test Conference, (ITC), Austin, TX, 2005, pp. 48.1-48.9.

56. F. Stellari, P. Song, and T.A. Christensen, “Advanced Optical Testing of an Array in 65 nm CMOS Technology”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2005, pp. 355-362.

57. A. Tosi, F. Stellari, and F. Zappa, “Innovative packaging technique for Backside optical testing of wire-bonded chips”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, 2005, pp. 1493-1498.

58. F. Stellari, P. Song, and W.D. Becker, “Local Probing of Switching Noise in VLSI Chips using Time Resolved Emission (TRE)”, Proc. of North Atlantic Test Workshop (NATW), Essex Junction, VT, May 11-13, 2005, pp. 130-137.

59. P. Song, F. Stellari, J.P. Eckhardt, T. McNamara, and C-L Tong, “Timing Analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD)”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2004, pp. 197-202.

60. F. Stellari, P. Song, T. Xia, and A.J. Weger, “Broken Scan Chain Diagnostics based on Time-Integrated and Time-Dependent Emission Measurements”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2004, pp. 52-57.

61. P. Song, F. Stellari, T. Xia, and A.J. Weger, “A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current”, Proc. of International Test Conference, (ITC), 2004, pp. 140-147. [PDF]

62. F. Stellari and P. Song, "Testing of ultra low voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD)", Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2004, pp. 1663-1668 (2004 ESREF Best Paper Award).

63. F. Stellari, A.J. Weger, P. Song, and M.K. McManus, “Dynamic Latchup Study using Transmission Line Pulses and Picosecond Imaging Circuit Analysis”, Proc. of European Solid-State Device Research Conference (ESSDERC), 2004, pp. 205-209.

64. F. Stellari and P. Song, “Testing of a Low Voltage 0.13 m CMOS Technology Microprocessor using a High Sensitivity Superconducting Single-Photon Detector”, Proc. of North Atlantic Test Workshop (NATW), Essex Junction, VT, May 13-14, 2004, pp. 151-156.

65. R. Rizzolo, T. Burdine, P. Song, F. Stellari, and H-J Nam, “High Voltage/Run-In Fails: A Diagnostic Detective Story”, Proc. of North Atlantic Test Workshop (NATW), Essex Junction, VT, May 13-14, 2004, pp. 165-172.

66. K.V. Chatty, P. Cottrell, R. Gauthier, M. Muhammad, F. Stellari, P. Song, and M.K. McManus, “Model-Based Guidelines to Suppress Cable Discharge Event (CDE)-Induced Latchup in CMOS ICs”, Proc. of International Symposium on Physics and Reliability (IRPS), Phoenix, AZ, Apr. 25-29, 2004, pp. 130-134.

67. F. Stellari, P. Song, A.J. Weger, and M.K. McManus, “Time-Resolved Optical Measurements from 0.13 m CMOS Technology Microprocessor using a Superconducting Single-Photon Detector”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Santa Clara, CA, Nov. 2-6, 2003, pp. 40-44.

68. F. Stellari, P. Song, M.K. McManus, A.J. Weger, R.J. Gauthier, K.V. Chatty, M. Muhammad, and P. Sanda, “Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Santa Clara, CA, Nov. 2-6, 2003, pp. 19-24.

69. F. Stellari, P. Song, M.K. McManus, A.J. Weger, R. Gauthier, K.V. Chatty, M. Muhammad, P. Sanda, P. Wu and S. Wilson, “Latchup Analysis Using Emission Microscopy”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, Oct. 6-10, 2003, pp. 1603-1608.

70. A. Tosi, F. Stellari, F. Zappa and S. Cova, “Backside Flip-Chip testing by means of high-bandwidth luminescence detection”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, Oct. 6-10, 2003, pp. 1669-1674.

71. R. Desplats, A. Eral, F. Beaudoin, P. Perdu, A.J. Weger, M.K. McManus, P. Song, and F. Stellari, “Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, Oct. 6-10, 2003, pp. 1663-1668.

72. F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K. Chatty, M. Muhammad, and P. Sanda, “Optical and Electrical Testing of Latchup in I/O Interface Circuits”, Proc. of International Test Conference, (ITC), Charlotte, NC, Sep. 30 - Oct. 2, 2003, pp. 236-245. [PDF]

73. A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Hot-carrier luminescence: comparison of different CMOS technologies”, Proc. of European Solid-State Device Research Conference (ESSDERC), Estoril, Portugal, Sept. 16-18, 2003, pp. 351-354. [PDF]

74. A.J. Weger, S. Voldman, F. Stellari, P. Song, P. Sanda, and M.K. McManus, “Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup”, Proc. of International Symposium on Physics and Reliability (IRPS), Dallas, Texas, Mar. 30 - Apr. 4, 2003, pp. 99-104.

75. A. Tosi, F. Zappa, S. Cova, and F. Stellari, “Luminescence measurements for the investigation of VLSI circuits defects”, Proc. of Italian Association of Sensors and Microsystems (AISEM), Trento, Italy, Feb. 11-14, 2003.

76. F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Circuit voltage probe based on time-integrated measurements of optical emission from leakage current”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, Arizona, Nov. 5-7, 2002, pp. 667-672.

77. F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Optical diagnosis of excess IDDQ in low power CMOS circuits”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Rimini, Italy, Oct. 7-11, 2002, pp. 1689-1694 (2002 ESREF Best Paper Award).

78. F. Stellari, A. Tosi, F. Zappa, and S. Cova, “CMOS circuit analysis with luminescence measurements and simulations”, Proc. of European Solid-State Device Research Conference (ESSDERC), Florence, Italy, Sept. 24-26, 2002, pp. 495-498.

79. A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Non invasive testing of ULSI circuits by means of a single-photon detector with 35ps time resolution”, Proc. of Italian Society of Physics (SIF), Milan, Italy, Sep. 28, 2001.

80. F. Stellari, F. Zappa, and S. Cova, “Wide-Bandwidth Contactless Testing of Signals in ULSI Circuits by means of Ultrafast Photon-Detectors”, Proc. of Italian Association of Sensors and Microsystems (AISEM), Pisa, Italy, Feb. 4-7, 2001.

81. F. Stellari, F. Zappa, S. Cova, and L. Vendrame, “Tools for Non-Invasive Optical Characterization of CMOS Circuits”, Tech. Dig. of International Electron Devices Meeting (IEDM), Washington DC, USA, Dec. 5-8, 1999, pp. 487-490.

82. F. Stellari, F. Zappa, M. Ghioni, and S. Cova, “Non-Invasive Optical Characterisation Technique for Fast Switching CMOS Circuits”, Proc. of European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium, Sept. 13-15, 1999, pp. 172-175.

Poster sessions of international conferences:

1. F. Stellari, K.A. Jenkins, A.J. Weger, B. Linder, and P. Song, "Self-Heating Characterization of FinFET SOI Devices using 2D Time Resolved Emission Measurements", Albany Nanotechnology Symposium (ANTS), Albany, NY, 2015 (2015 ANTS Best Poster Award).

2. F. Stellari, P. Song, and A.J. Weger, "Applications and Techniques for 2D Picosecond Imaging for Circuit Analysis", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. 321-326 (2014 ISTFA Best Poster Award).

3. A. Bahgat Shehata, F. Stellari, A. Weger, and P. Song, V. Anant, K. Sunter, and K. Berggren, "Future technology VLSI testing at ultra low voltage feasible by using Time Resolved Emission based on an SnSPD", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. .

4. F. Stellari, P. Song, J. Hryckowian, O.A. Torreiter, S. Wilson, P. Wu, and A. Tosi, “Characterization of a 0.13 um CMOS Link Chip using Time Resolved Emission (TRE)”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, 2005, pp. 1550-1553.

5. A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Current crowding in faulty MOSFET: optical and electrical investigation”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2004.

6. F. Stellari, C. Porta, F. Zappa, M. Ghioni, and S. Cova, “New Technique for Non Invasive Testing of ULSI Circuits”, GE 2000, Italian Electronic Group, Bologna, Italy, Jun. 6,2000.

7. S. Cova, C. Porta, F. Stellari, F. Zappa and J. Tsang, “Testing CMOS Circuits at 50ps Resolution with Single-Photon Avalanche Detectors”, Proc. of European Solid-State Device Research Conference (ESSDERC), Cork, Ireland, Sep. 11-13, 2000.

Blogs:

1. F. Stellari, "Deployment and configuration of MVI-Edge using KubeStellar", Medium.com, https://medium.com/@francostellari/deployment-and-configuration-of-mvi-edge-using-kubestellar-8972ea949ebd.

2. F. Stellari, "Unleashing the Power of Kubernetes: Deploying Containers with Cluster Resource Access", Medium.com, https://medium.com/itnext/unleashing-the-power-of-kubernetes-deploying-containers-with-cluster-resource-access-ee2cef29e24e.