Publications

Google Scholar results

Papers in international journals and magazines:

  1. F. Stellari, P. Song, and A.J. Weger, "Single Photon Detectors for Ultra Low Voltage Time Resolved Emission Measurements", IEEE J. on Quantum Electronics, vol. 47, no. 6, 2011, pp 841-848.
  2. M. Meterelliyoz, P. Song, F. Stellari, J.P. Kulkarni, and K. Roy, "Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor", IEEE Trans. on Circuits and Systems I, no. 99, 2010, pp. 1-10.
  3. B.L. Ji, D.J. Pearson, I. Lauer, F. Stellari, D.J. Frank, L. Chang, and M.B. Ketchen, “Operational amplifier based test structure for transistor threshold voltage variation”, IEEE Trans. on Semiconductor Manufacturing, vol. 22, no. 1, 2009, pp. 51-58.
  4. A. Tosi, F. Stellari, F. Zappa, and P. Song, “A packaging solution for optically testing wire-bonded chips”, IEEE Trans. on Advanced Packaging, vol. 31, no. 3, 2008, pp. 490-495.
  5. F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Testing and diagnostics of CMOS circuits using Light Emission from Off-State Leakage Current”, IEEE Trans. on Electron Devices, vol. 51, no. 9, 2004, pp. 1455-1462 (IEEE-EDS Paul Rappaport Award).
  6. F. Stellari, A. Tosi, F. Zappa, and S. Cova, “CMOS circuit testing via tme-resolved luminescence measurements and simulations”, IEEE Trans. on Instrumentation and Measurement, vol. 53, no. 1, 2004, pp. 163-169.
  7. F. Stellari, F. Zappa, S. Cova, C. Porta, and J.C. Tsang, “High-speed CMOS circuit testing by 50ps time-resolved luminescence measurements”, IEEE Trans. on Electron Devices, vol. 48, no. 12, Dec. 2001, pp. 2830-2835.
  8. F. Stellari, F. Zappa, S. Cova, and L. Vendrame, “Tools for contactless testing and simulation of CMOS circuits”, Microelectronic Reliability, vol. 41, no. 11, Nov. 2001, pp. 1801-1808.
  9. F. Stellari and A.L. Lacaita, “New formulas of interconnect capacitances based on results of conformal mapping method”, IEEE Trans. on Electron Devices, vol. 47, no. 1, Jan. 2000, pp. 222-231.

Invited papers in international journals and magazines:

  1. F. Stellari, C-C Lin, and P. Song, "Automated high-resolution imaging of very large fields of view (FOV)", Electronic Device Failure Analysis (EDFA) Magazine, vol. 17. no. 3, Aug. 2015, pp. 12-19.
  2. P. Song, S. Polonsky, F. Stellari, K. Jenkins, A.J. Weger, T. Xia, and S. Cho, “CMOS IC diagnostics using the Light Emission from Off-state Leakage Currents”, Electronic Device Failure Analysis (EDFA), vol. 7, no. 3, Aug. 2005, pp. 12-19.
  3. F. Stellari, P. Song, A. Weger, M.K. McManus, R. Gauthier, and P. Sanda, “Electrical and optical characterization of latchup”, Microelectronic Failure Analysis Desk Reference (MFADR), 2004, pp. 174-192.
  4. F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K.V. Chatty, M. Muhammad, and P. Sanda, “Analysis of factors impacting latchup in I/O interface circuits using a combined optical and electrical testing method”, Electronic Device Failure Analysis (EDFA), vol. 6, no. 3, Aug. 2004, pp. 20-29.

Invited papers at international conferences:

  1. L.M. Gignac, C. Beslin, J. Gonsalves, F. Stellari, and C.-C. Lin, "High energy BSE/SE/STEM imaging of 8 um thick semiconductor interconnects", Microscopy & Microanalysis, 2014.
  2. F. Stellari and P. Song, “Testing of Ultra Low Voltage CMOS Microprocessors using the Superconducting Single-Photon Detector (SSPD)”, Proc. of International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, June 27-July 1, 2005, p. 2.
  3. P. Song, F. Stellari, and M.K. McManus, “Time-Resolved Emission Testing Challenges for Low Voltage CMOS Technologies”, Proc. of Laser and Electro-Optics Society (LEOS), Tucson, Arizona, Oct. 26-30, 2003, pp. 596-597.
  4. P. Song, F. Stellari, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Testing of Low Power CMOS Circuits using Optical Emission from Leakage Current”, Proc. of International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, July 7-11, 2003.

Papers presented at international conferences:

  1. F. Stellari, C-C Lin, L. Gignac, R. Robertazzi, A. Weger, and P. Song, "Techniques for Reverse Engineering and Functionality Extraction of Mixed-Signal ICs for Security Applications", accepted at Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Portland, OR, 2015.
  2. L.M. Gignac, C.M. Breslin, J. Gonsalves, F. Stellari, and C.-C. Lin, "Very High Energy (300-400 keV) SEM imaging of Cu Interconnects", Scanning Microscopies, 2015
  3. A. Bahgat Shehata, A. Ruggeri, F. Stellari, A.J. Weger, P. Song, and V. Anant, "Effect of Temperature on Superconducting Nanowire Single-Photon Detector Noise", accepted at SPIE Optics + Photonics, San Diego, CA, 2015.
  4. F. Stellari, K.A. Jenkins, A.J. Weger, B. Linder, and P. Song, "Self-Heating Characterization of FinFET SOI Devices using 2D Time Resolved Emission Measurements", Proc. of International Symposium on Physics and Reliability (IRPS), Monterey, CA, 2015.
  5. A. Bahgat Shehata, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and E. Ramsay, "Time Integrated Photon Emission as a Function of Temperature in 32 nm CMOS", Proc. of International Symposium on Physics and Reliability (IRPS), Monterey, CA, 2015.
  6. A. Bahgat Shehata and F. Stellari, "Tuning of Superconducting Nanowire Single Photon Detector parameters for VLSI circuit testing using Time Resolved Emission", SPIE Photonic West Opto, San Francisco, CA, 2015.
  7. C-C Lin and F. Stellari, "Automated Mapping of Very Large Areas of VLSI Circuit using SIL", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. 12-18.
  8. A. Bahgat Shehata, F. Stellari, A. Weger, P. Song, H. Deslandes, E. Ramsay, and T. Lundquist, "Novel NIR camera with extended sensitivity and low noise for photon emission microscopy of VLSI circuits",Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. 6-11.
  9. A. Bahgat Shehata, F. Stellari, A.J. Weger, and P. Song, "Modeling of Transient and Static Components of Intrinsic Emission from VLSI Circuits", Proc. of International Symposium on Physics and Reliability (IRPS), Waikoloa, HI, 2014, pp. 4A.1.1-4A.1.7.
  10. F. Stellari, P. Song, A.J. Weger, J. Culp, A. Herbert, and D. Pfeiffer, "Verification of Untrusted Chips using Trusted Layout and Emission Measurements", IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), Arlington, VA, 2014, pp. 19-24.
  11. F. Stellari, P. Song, and H.A. Ainspan, "Functional Block Extraction for Hardware Security Detection using Time-Integrated and Time-Resolved Emission Measurements", Proc. VLSI Test Symposium (VTS), Napa, CA, 2014, pp. 1-6.
  12. E. Ramsay, H. Deslandes, T. Lundquist, K. Sunter, K. Berggren, V. Anant, U. Kindereit, A. Baghat Shehata, F. Stellari, A.J. Weger, and P. Song, "Logic Analysis Tool", Government Microcircuit Applications & Critical Technology Conference (GOMACTECH), Charleston, SC, March 31- April 3, 2014.
  13. A.J. Weger, F. Stellari, S. Kim, H.A. Ainspan, Y. Kwark, C.W. Bak, D. Maliuk and P. Song, "32nm CMOS SOI Test Site for Emission Tool Evaluation", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013.
  14. C.C. Lin, F. Stellari, L. Gignac, P. Song, and J. Bruley, "Automatic Registering and Stitching of TEM/STEM Image Mosaics", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013.
  15. F. Stellari, P. Song, A.J. Weger, D. Maliuk, H.A. Ainspan, S.Kim, Y. Kwark, and C.W. Baks, "Tester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurements", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013.
  16. F. Stellari, A.J. Weger, S. Kim, D. Maliuk, P. Song, H.A. Ainspan, Y. Kwark, C.W. Baks, U. Kindereit, V. Anant, and T. Lundquist, "Superconducting Nanowire Single-Photon Detector (SnSPD) System for Ultra Low Voltage Time-Resolved Emission (TRE) Measurements of VLSI Circuits", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2013, pp. 182-188.
  17. F. Stellari and P. Song, "Advanced methods and software for enhancing analytical tools capabilities during chip diagnostic and characterization", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, 2012.
  18. U. Kindereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni, "Comparison of Near-Infrared Photon Emission Spectroscopy of a 45 nm and 32 nm SOI Ring Oscillators", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, 2012.
  19. Ji. Chen, P. Song, T. Shaw, F. Stellari, L. Gignac, C. Breslin, D. Pfeiffer, and G. Bonila, "A Novel Integrated Reliability Test System for BEOL TDDB Study", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, AZ, 2012.
  20. F. Stellari, T. Cowell, P. Song, M. Sorna, Z. Toprak-Deniz, J.F. Bulzacchelli, and N.A. Mitra, "Root cause identification of an hard-to-find on-chip power supply coupling fail",  Proc. of International Test Conference (ITC), Anaheim, CA, 2012.
  21. P. Song and F. Stellari, "Tester-Based Optical and Electrical Diagnostic System and Techniques", Proc. of VLSI Test Symposium (VTS), Maui, Hawai 2012.
  22. U. Kindereit, A.J. Weger, F. Stellari, P. Song, H. Deslandes, T. Lundquist, and P. Sabbineni, "Near-infrared Photon Emission Spectroscopy of a 45 nm SOI Ring Oscillator", Proc. of International Symposium on Physics and Reliability (IRPS), Anaheim, CA, 2012.
  23. F. Stellari, P. Song, A.J. Weger, T. Nakamura, S. Kim, and R. Roche, "A Position Sensitive Single Photon Detector with Enhanced NIR Response", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose (CA), 2011.
  24. P. Song, F. Stellari, A. Weger, D. Phiper, "MARVEL - Malicious Alteration Recognition and Verification by Emission of Light", IEEE Int. Symp. on Hardware-Oriented Security and Trust (HOST), San Diego, CA, 2011.
  25. K. Stawiasz, K.A. Jenkins, P. Song, F. Stellari, J. Tierno, A. Rylyakov, and D. Friedman, "Characterization of the Digital PLLs on an 8-Core Microprocessor Using Electrical and Optical Techniques", IEEE VLSI Test Symposium (VTS), Dana Point, CA, 2011.
  26. F. Stellari, P. Song, and A.J. Weger, "Single-photon detectors for ultra-low-voltage time-resolved emission measurements of VLSI circuits", SPIE Defense, Security & Sensing - Advanced Photon Counting Techniques V, Orlando, FL, 2011.
  27. F. Stellari, S.E. Steen, K.C. Fisher, and X. Shao, "Photovoltaic (PV) cells characterization using advanced optical tools", Proc. of International Symposium on Physics and Reliability (IRPS), Anaheim, CA, 2010.
  28. F. Stellari, P. Song, J. Sylvestri, D. Miles, O. Forlenza, and D. Forlenza, "On-Chip Power Supply Noise Measurement using Time Resolved Emission (TRE) Waveforms of Light Emission from Off-State Leakage Current (LEOSLC)", Proc. of International Test Conference (ITC), Austin, TX, 2009, pp. 1-10.
  29. F. Stellari, P. Song, A.J. Weger, and D.L. Miles, "Mapping Systematic and Random Process Variations using Light Emission from Off-State Leakage", Proc. of International Symposium on Physics and Reliability (IRPS), Montreal, Canada, 2009, pp. 640-649.
  30. F. Stellari, P. Song, J. Vickers, C. Shaw, S. Kasapi, and R. Ispasoiu, “Evaluating PICA capability for future low voltage SOI chips”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Portland (OR), 2008, pp. 407-416. 
  31. P. Song, S. Ippolito, F. Stellari, J. Sylvestri, T. Diemoz, G. Smith, P. Muench, N. James, S. Kim, and H. Saenz, “Optical Diagnostics for IBM POWER6TM Microprocessor”, Proc. of International Test Conference (ITC), Santa Clara, (CA), 2008.
  32. M. Meterelliyoz, P. Song, F. Stellari, J.P. Kulkarni, and K. Roy, “A High Sensitivity Process Variation Sensor Utilizing Sub-threshold Operation”, Proc. Custom Integrated Circuits Conference (CICC), San Jose, CA, 2008 (AMD/CICC Student Scholarship Award).
  33. B.L. Ji, D.J. Pearson, I. Lauer, L. Chang, F. Stellari, M.B. Ketchen, “Operational Amplifier Based Test Structure for Transistor Threshold Voltage Variation”, Proc. International Conference on Microelectronic Test Structures (ICMTS), Edinburgh, Scotland, 2008, pp. 3-7. 
  34. F. Stellari, P. Song, T.E. Diemoz, A.J. Weger, T. Vogel, S.C. Wilson, J. Pennings, and R.F. Rizzolo, “High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images”, Proc. of International Test Conference, (ITC), San Jose, CA, 2006, pp. 1-10.
  35. F. Stellari, A. Tosi, and P. Song, “Switching Time Extraction of CMOS Gates using Time-Resolved Emission (TRE)”, Proc. of International Symposium on Physics and Reliability (IRPS), San Jose, CA, 2006, pp. 566-573.
  36. A. Tosi, F. Stellari, A. Pigozzi, G. Marchesi, and F. Zappa, “Characterization of backside hot-carrier luminescence in scaled CMOS technologies”, Proc. of International Symposium on Physics and Reliability (IRPS), San Jose, CA, 2006, pp 595-601.
  37. P. Song, F. Stellari, B. Huott, O. Wagner, U. Srinivasan, Y. Chan, R. Rizzolo, H.J. Nam, J. Eckhardt, T. McNamara, C-L Tong, S. Wilson, A.J. Weger, and M.K. McManus, “An Advanced Optical Diagnostic Technique for IBM Microprocessor”, Proc. of International Test Conference, (ITC), Austin, TX, 2005, pp. 48.1-48.9.
  38. F. Stellari, P. Song, and T.A. Christensen, “Advanced Optical Testing of an Array in 65 nm CMOS Technology”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), San Jose, CA, 2005, pp. 355-362.
  39. A. Tosi, F. Stellari, and F. Zappa, “Innovative packaging technique for Backside optical testing of wire-bonded chips”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, 2005, pp. 1493-1498.
  40. F. Stellari, P. Song, and W.D. Becker, “Local Probing of Switching Noise in VLSI Chips using Time Resolved Emission (TRE)”, Proc. of North Atlantic Test Workshop (NATW), Essex Junction, VT, May 11-13, 2005, pp. 130-137.
  41. P. Song, F. Stellari, J.P. Eckhardt, T. McNamara, and C-L Tong, “Timing Analysis of a Microprocessor PLL using High Quantum Efficiency Superconducting Single Photon Detector (SSPD)”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2004, pp. 197-202.
  42. F. Stellari, P. Song, T. Xia, and A.J. Weger, “Broken Scan Chain Diagnostics based on Time-Integrated and Time-Dependent Emission Measurements”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), 2004, pp. 52-57.
  43. P. Song, F. Stellari, T. Xia, and A.J. Weger, “A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current”, Proc. of International Test Conference, (ITC), 2004, pp. 140-147. [PDF]
  44. F. Stellari and P. Song, "Testing of ultra low voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD)", Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2004, pp. 1663-1668 (ESREF Best Paper Award).
  45. F. Stellari, A.J. Weger, P. Song, and M.K. McManus, “Dynamic Latchup Study using Transmission Line Pulses and Picosecond Imaging Circuit Analysis”, Proc. of European Solid-State Device Research Conference (ESSDERC), 2004, pp. 205-209.
  46. F. Stellari and P. Song, “Testing of a Low Voltage 0.13 m CMOS Technology Microprocessor using a High Sensitivity Superconducting Single-Photon Detector”, Proc. of North Atlantic Test Workshop (NATW), Essex Junction, VT, May 13-14, 2004, pp. 151-156.
  47. R. Rizzolo, T. Burdine, P. Song, F. Stellari, and H-J Nam, “High Voltage/Run-In Fails: A Diagnostic Detective Story”, Proc. of North Atlantic Test Workshop (NATW), Essex Junction, VT, May 13-14, 2004, pp. 165-172.
  48. K.V. Chatty, P. Cottrell, R. Gauthier, M. Muhammad, F. Stellari, P. Song, and M.K. McManus, “Model-Based Guidelines to Suppress Cable Discharge Event (CDE)-Induced Latchup in CMOS ICs”, Proc. of International Symposium on Physics and Reliability (IRPS), Phoenix, AZ, Apr. 25-29, 2004, pp. 130-134.
  49. F. Stellari, P. Song, A.J. Weger, and M.K. McManus, “Time-Resolved Optical Measurements from 0.13 m CMOS Technology Microprocessor using a Superconducting Single-Photon Detector”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Santa Clara, CA, Nov. 2-6, 2003, pp. 40-44.
  50. F. Stellari, P. Song, M.K. McManus, A.J. Weger, R.J. Gauthier, K.V. Chatty, M. Muhammad, and P. Sanda, “Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Santa Clara, CA, Nov. 2-6, 2003, pp. 19-24.
  51. F. Stellari, P. Song, M.K. McManus, A.J. Weger, R. Gauthier, K.V. Chatty, M. Muhammad, P. Sanda, P. Wu and S. Wilson, “Latchup Analysis Using Emission Microscopy”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, Oct. 6-10, 2003, pp. 1603-1608.
  52. A. Tosi, F. Stellari, F. Zappa and S. Cova, “Backside Flip-Chip testing by means of high-bandwidth luminescence detection”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, Oct. 6-10, 2003, pp. 1669-1674.
  53. R. Desplats, A. Eral, F. Beaudoin, P. Perdu, A.J. Weger, M.K. McManus, P. Song, and F. Stellari, “Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, Oct. 6-10, 2003, pp. 1663-1668.
  54. F. Stellari, P. Song, M.K. McManus, R. Gauthier, A.J. Weger, K. Chatty, M. Muhammad, and P. Sanda, “Optical and Electrical Testing of Latchup in I/O Interface Circuits”, Proc. of International Test Conference, (ITC), Charlotte, NC, Sep. 30 - Oct. 2, 2003, pp. 236-245. [PDF]
  55. A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Hot-carrier luminescence: comparison of different CMOS technologies”, Proc. of European Solid-State Device Research Conference (ESSDERC), Estoril, Portugal, Sept. 16-18, 2003, pp. 351-354. [PDF]
  56. A.J. Weger, S. Voldman, F. Stellari, P. Song, P. Sanda, and M.K. McManus, “Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup”, Proc. of International Symposium on Physics and Reliability (IRPS), Dallas, Texas, Mar. 30 - Apr. 4, 2003, pp. 99-104.
  57. A. Tosi, F. Zappa, S. Cova, and F. Stellari, “Luminescence measurements for the investigation of VLSI circuits defects”, Proc. of Italian Association of Sensors and Microsystems (AISEM), Trento, Italy, Feb. 11-14, 2003.
  58. F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Circuit voltage probe based on time-integrated measurements of optical emission from leakage current”, Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Phoenix, Arizona, Nov. 5-7, 2002, pp. 667-672.
  59. F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen, “Optical diagnosis of excess IDDQ in low power CMOS circuits”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Rimini, Italy, Oct. 7-11, 2002, pp. 1689-1694 (ESREF Best Paper Award).
  60. F. Stellari, A. Tosi, F. Zappa, and S. Cova, “CMOS circuit analysis with luminescence measurements and simulations”, Proc. of European Solid-State Device Research Conference (ESSDERC), Florence, Italy, Sept. 24-26, 2002, pp. 495-498.
  61. A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Non invasive testing of ULSI circuits by means of a single-photon detector with 35ps time resolution”, Proc. of Italian Society of Physics (SIF), Milan, Italy, Sep. 28, 2001.
  62. F. Stellari, F. Zappa, and S. Cova, “Wide-Bandwidth Contactless Testing of Signals in ULSI Circuits by means of Ultrafast Photon-Detectors”, Proc. of Italian Association of Sensors and Microsystems (AISEM), Pisa, Italy, Feb. 4-7, 2001.
  63. F. Stellari, F. Zappa, S. Cova, and L. Vendrame, “Tools for Non-Invasive Optical Characterization of CMOS Circuits”, Tech. Dig. of International Electron Devices Meeting (IEDM), Washington DC, USA, Dec. 5-8, 1999, pp. 487-490.
  64. F. Stellari, F. Zappa, M. Ghioni, and S. Cova, “Non-Invasive Optical Characterisation Technique for Fast Switching CMOS Circuits”, Proc. of European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium, Sept. 13-15, 1999, pp. 172-175.

Poster sessions of international conferences:

  1. F. Stellari, P. Song, and A.J. Weger, "Applications and Techniques for 2D Picosecond Imaging for Circuit Analysis", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. 321-326 (ISTFA Best Poster Award).
  2. A. Bahgat Shehata, F. Stellari, A. Weger, and P. Song, V. Anant, K. Sunter, and K. Berggren, "Future technology VLSI testing at ultra low voltage feasible by using Time Resolved Emission based on an SnSPD", Proc. of International Symposium for Testing and Failure Analysis (ISTFA), Houston, TX, 2014, pp. .
  3. F. Stellari, P. Song, J. Hryckowian, O.A. Torreiter, S. Wilson, P. Wu, and A. Tosi, “Characterization of a 0.13 um CMOS Link Chip using Time Resolved Emission (TRE)”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France, 2005, pp. 1550-1553.
  4. A. Tosi, F. Stellari, F. Zappa, and S. Cova, “Current crowding in faulty MOSFET: optical and electrical investigation”, Proc. of European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), 2004.
  5. F. Stellari, C. Porta, F. Zappa, M. Ghioni, and S. Cova, “New Technique for Non Invasive Testing of ULSI Circuits”, GE 2000, Italian Electronic Group, Bologna, Italy, Jun. 6,2000.
  6. S. Cova, C. Porta, F. Stellari, F. Zappa and J. Tsang, “Testing CMOS Circuits at 50ps Resolution with Single-Photon Avalanche Detectors”, Proc. of European Solid-State Device Research Conference (ESSDERC), Cork, Ireland, Sep. 11-13, 2000.

Last update on 2015-07-16