Embedded Files
A high resolution FE-SEM for simple inspection of conductive samples showing topographic detail and/or material contrast. Samples must be vacuum compatible, clean, and conductive.
A high resolution FE-SEM for simple inspection of conductive samples showing topographic detail and/or material contrast. Samples must be vacuum compatible, clean, and conductive.
Includes:
Includes:
- Everhart-Thornley secondary electron detectors
- Gentle Beam imaging mode for very low voltage (GB)
- Scanning transmission electron detector (STEM)
- Low magnification viewing mode
- Backscatter detector (BSED)
- EDAX detector for elemental x-ray analysis (EDS)
Page updated
Report abuse