(2026)
4. H. Lee and S. Kang, Registration No. (USA): US12670965B2 , Registration Date: 2026.06.30.
"Non-Linear Memory Failure Analysis Method and Memory Test Apparatus"
(2024)
3. H. Lee and S. Kang, Registration No. (Japan): JP7608560B2 , Registration Date: 2024.12.20.
"Method for Storing Memory Fault Data, Apparatus and Computer Program for Performing the Method"
(2022)
2. H. Lee and S. Kang, Registration No. (USA): US11386973B2, Registration Date: 2022.07.12.
"Method and Apparatus for Built in Redundancy Analysis with Dynamic Fault Reconfiguration"
1. D. Han, H. Lee, and S. Kang, Registration No. (USA): US11315657B2 , Registration Date: 2022.04.26.
"Stacked Memory Apparatus Using Error Correction Code and Repair Method Thereof"
(2026)
5. H. Lee and S. Kang, Application No. (USA): 19/737,448, Application Date: 2026.07.10.
"Memory Fault Data Transmission Apparatus and Method Based on Repairability"
4. H. Lee, Application No. (PCT): PCT/KR2026/007141, Application Date: 2026.06.25.
"Processing-In-Memory Device With Operatrion Data Compression/Decompression, Artificial Inetelligence Inference System and Method Thereof,
3. Y. Hwang, S. Jang, Y. Kang, and H. Lee, Application No. (PCT): PCT/KR2026/007143, Application Date: 2026.06.17.
"Fault-Tolerant Processing-In-Memory System and Fault-Tolerant Operation Control Method"
(2024)
2. H. Lee and S. Kang, Application No. (USA): 18/795537, Application Date: 2024.08.06.
"Apparatus and Method for Pre-Analyzing Memory Fault Information"
(2023)
1. H. Lee and S. Kang, Application No. (USA): 18/490671, Application Date: 2023.10.19.
"Method for Storing Memory Fault Data, Apparatus and Computer Program for Performing the Method"