Keywords: Capacitance Sensor Interface, CT Sigma Delta ADC, Noise Analysis, Oscillators

ISCAS 16, MWSCAS 16, SOCC 17, VLSID 17, 19, Measurement Journal

Publication List

1. [J1] Time of Arrival Measurement for Indoor Distance Monitoring in 130-nm CMOS, Javed S. Gaggatur and Gaurab Banerjee - Measurement, 2019
2. [C5] A 75 uW 2.4GHz Wake-up Receiver in 65-nm CMOS for Neonatal Healthcare Application, Kundan Kumar, Raghunath K P, Akshay Muraleedharan, Javed S Gaggatur, and Gaurab Banerjee, 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems.(VLSID 2019), January 5-9, 2019, New Delhi, India.
3. [C4] A 13.5bit 1.6mW 3rd order CT ΔΣ ADC for Integrated Capacitance Sensor Interface, Javed S. Gaggatur and Gaurab Banerjee, 30th IEEE International System-on-Chip Conference (IEEE SOCC 2017), September 5-8, 2017, Munich, Germany.
4. [C3] High Gain Capacitance Sensor Interface for the Monitoring of Cell Volume Growth, Javed S. Gaggatur and Gaurab Banerjee, 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems.(VLSID 2017), January 7-11, 2017, Hyderabad, India.
5. [C2] Noise Analysis in Ring Oscillator-based Capacitance Sensor Interface, Javed S. Gaggatur and Gaurab Banerjee, 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS), October 16-19, 2016, Abu Dhabi, United Arab Emirates (UAE).
6. [C1] A 3.2mW 0.13um High Sensitivity Frequency-domain CMOS Capacitance Interface", Javed S. Gaggatur, Pradeep K. Dixena and Gaurab Banerjee, " International Symposium of Circuits and Systems, ISCAS 2016, May 22-25, Montreal, QC, Canada.