Alumni (Seoul National U.)
Alumni (Seoul National U.)
PhD
MS
2016.03 ~ 2022.02 Korea University (EE), BS
2022.03 ~ 2025.02 Seoul National University (EE), MS
Email: hunyver@snu.ac.kr
Thesis: In-Memory Boolean Logic Operations Using Charge-Trapping Tunnel Field-Effect Transistors
2016.03 ~ 2022.08 Seoul National University (EE), BS
2022.09 ~ 2025.02 Seoul National University (EE), MS
Email: hjy1292@snu.ac.kr
Thesis: Impact of Work-Function Variation on Scaled Ferroelectric Field-Effect Transistors
2008.03 ~ 2015.02 Kyunghee University (EE), BS
2015.03 ~ Samsung Electronics Co.,Ltd
2023.03 ~ 2025.02 Seoul National University (EE), MS
Email: jeong9840@naver.com
Thesis: Lifetime Prediction for Hot-Carrier-Induced Degradation of P-MOSFETs in the Subthreshold Region
Alumni (Sogang U.)
PhD
2008 ~ 2014 Sogang University (EE), BS
2014 ~ 2021 Sogang University (EE), PhD
2021 ~ 2022 Sogang University (EE), Post-doctor
(BK21 FOUR program)
2022 ~ 2023 Seoul National U. (EE), Post-doctor
2023 ~ SKKU, Post-doctor
Thesis
Tunnel Field-Effect Transistors (TFETs) as Silicon-Based Synaptic Devices for Neuromorphic Computing Systems
2008 ~ 2014 Sogang University (EE), BS
2015 ~ 2022 Sogang University (EE), PhD
2022 ~ 2022 Seoul National U. (EE), Post-doctor
2023 ~ Agency for Defense Development,
Researcher
Thesis
Monolithic Three-Dimensional CMOS–NEM Reconfigurable Logic Circuits
MS
2003 ~ 2009 Sogang University (EE), BS
2009 ~ 2011 Sogang University (EE), MS
2011 ~ 2015 SK Hynix
2015 ~ KARI
Thesis
Tunneling Field-Effect Transistors for Low-Power Circuit Applications
2003 ~ 2009 Sogang University (EE), BS
2010 ~ 2012 Sogang University (EE), MS
2012 ~ SK Hynix
Thesis
Scaling Trend of Nanoelectromechanical (NEM) Nonvolatile Memory Cells Based on Finite Element Analysis (FEA)
2006 ~ 2010 Sogang University (EE), BS
2010 ~ 2012 Sogang University (EE), MS
2012 ~ SK Hynix
Thesis
Hetero-Gate-Dielectric Tunneling Field-Effect Transistors (HG TFETs) for Low-Power Circuit Applications
2006 ~ 2010 Sogang University (EE), BS
2010 ~ 2012 Sogang University (EE), MS
2012 ~ SK Hynix
Thesis
Analytical Model of Single-Gate Silicon-on-Insulator (SOI) Tunneling Field-Effect Transistors (TFETs)
2003 ~ 2010 Sogang University (EE), BS
2010 ~ 2012 Sogang University (EE), MS
2012 ~ Samsung Electronics
Thesis
Nano-Electromechanical (NEM) Nonvolatile Memory Cells (T cells) for Multi-Bit operation
2004 ~ 2011 Sogang University (EE), BS
2011 ~ 2013 Sogang University (EE), MS
2013 ~ Samsung Electronics
Thesis
A Study on Hetero-Gate-Dielectric Tunneling Field-Effect Transistors
2007 ~ 2011 Sogang University (EE), BS
2011 ~ 2013 Sogang University (EE), MS
2013 ~ SK Hynix
Thesis
Fringe Field Effects on Nano-Electromechanical (NEM) Memory Cells
2005 ~ 2012 Sogang University (EE), BS
2012 ~ 2014 Sogang University (EE), MS
2014 ~ Samsung Electronics
Thesis
Hetero-Gate-Dielectric Tunneling Field-Effect Tran-sistors (HG TFETs) for Highly Energy Efficient ICs
2006 ~ 2012 Sogang University (EE), BS
2012 ~ 2014 Sogang University (EE), MS
2014 ~ Samsung Electronics
Thesis
Lateral Nano-Electromechanical (NEM) Relays for Reconfigurable Logic
2006 ~ 2012 Dankook University (EE), BS
2012 ~ 2014 Sogang University (EE), MS
2014 ~ SK Hynix
Thesis
Influence of Random Dopant Fluctuation (RDF) on NAND Flash Memory Cells
2007 ~ 2012 Sogang University (EE), BS
2012 ~ 2014 Sogang University (EE), MS
2014 ~ SK Hynix
Thesis
Bit-to-Bit Interference of Multi-Bit Nano-Electro-mechanical Memory Cells (T cells)
2007 ~ 2013 Sogang University (EE), BS
2013 ~ 2015 Sogang University (EE), MS
2015 ~ Samsung Electronics
Thesis
Work-Function Variation Effects of Tunneling Field-Effect Transistors (TFETs)
2007 ~ 2013 Sogang University (EE), BS
2012 ~ 2015 Sogang University (EE), MS
2015 ~ SK Hynix
Thesis
Nonvolatile Nano-Electromechanical (NEM) Memory Switches for Reconfigurable Logic
2009 ~ 2013 Sejong University (EE), BS
2013 ~ 2016 Sogang University (EE), MS
2016 ~ 2017 National NanoFab Center
2017 ~ 2018 DB Hitek
2018 ~ ON Semiconductor
Thesis
Rounded-Corner Tunnel Field-Effect Transistors (RC TFETs) for Performance Enhancement
2007 ~ 2013 Sogang University (EE), BS
2013 ~ 2016 Sogang University (EE), MS
2016 ~ Samsung Electronics
Thesis
Subthreshold-Slope-Adjustable Tunnel Field-Effect Transistor- Based Random Access Memories (STRAMs) for Low-Power Storage Devices
2009 ~ 2013 Sejong University (EE), BS
2013 ~ 2016 Sogang University (EE), MS
2016 ~ Hanwha Corporation/Defense
Thesis
Influence of Electron and Hole Distribution on 2T SONOS Embedded NVMon 2T SONOS Embedded NVM
2008 ~ 2014 Sogang University (EE), BS
2014 ~ 2016 Sogang University (EE), MS
2016 ~ Samsung Electronics
Thesis
Three-Dimensional Reconfigurable Logic (RL) Circuits Based on Extremely Low-Power Electron Devices
2007 ~ 2014 Sogang University (EE), BS
2014 ~ 2016 Sogang University (EE), MS
Thesis
Process Variation Effects of Tunnel Field Effect Transistors (TFETs)
2008 ~ 2014 Soongsil University (EE), BS
2014 ~ 2016 Sogang University (EE), MS
2016 ~ STATS ChipPAC Korea
Thesis
Drain Current Modeling of Sub-70-nm PMOSFETs Dependent on Hot-Carrier Stress Bias Conditions
2007 ~ 2015 Sogang University (EE), BS
2015 ~ 2017 Sogang University (EE), MS
2017 ~ SK Hynix
Thesis
Process Development for CMOS-Nano-Electro-mechanical System (NEMS) Co-integration
2009 ~ 2015 Sogang University (EE), BS
2015 ~ 2017 Sogang University (EE), MS
2017 ~ Samsung Electronics
Thesis
Mathematical Model of Transition-Metal-Dichalco-genide-Based (TMD-Based) Tunnel Field-Effect Transistors (TFETs)
2010 ~ 2016 Sogang University (PHY), BS
2016 ~ 2018 Sogang University (EE), MS
2018 ~ ASML
Thesis
Switching Voltage Analysis of Nano-Electromecha-nical (NEM) Memory Switches for CMOS-NEM Hybrid Reconfigurable Logic Applications
2011 ~ 2017 Kyonggi University (AME), BS
2017 ~ 2019 Sogang University (EE), MS
2019 ~ DB Hitek
Thesis
Encapsulation of NEM Memory Switches for Mono-lithic-Three-Dimensional (M3D) CMOS-NEM Hybrid Circuits
2011 ~ 2017 Dongguk University (PHY), BS
2017 ~ 2019 Sogang University (EE), MS
2019 ~ SK Hynix
Thesis
Degradation Modeling of DRAM Storage Capacitors
2012 ~ 2018 Sogang University (EE), BS
2018 ~ 2020 Sogang University (EE), MS
2020 ~ Samsung Electronics
Thesis
Scaling of Monolithic 3D CMOS-Nanoelectro-mechanical Reconfigurable Logic Circuits
2014 ~ 2018 Sejong University (AME), BS
2018 ~ 2020 Sogang University (EE), MS
2020 ~ Samsung Electronics
Thesis
Low-Operation-Voltage Nanoelectromechanical (NEM) Memory Switches using Dynamic Slingshot Operation
2012 ~ 2019 Sogang University (PHY), BS
2019 ~ 2021 Sogang University (EE), MS
2021 ~ ASML
Thesis
Investigation on the Hump Behavior of Gate-Normal Nanowire Tunnel Field-Effect Transistors (NWTFETs)
2010 ~ 2017 Konkook University (PHY, AE), BS
2019 ~ 2021 Sogang University (EE), MS
Thesis
Offset Contribution Analysis for DRAM Offset Can-cellation Sensing Scheme
2015 ~ 2019 Dankook University (EEE), BS
2019 ~ 2021 Sogang University (EE), MS
2021 ~ Samsung Electronics
Thesis
LTPS (Low-Temperature Polycrystalline Silicon) TFT with an amorphous silicon buffer layer and source/ drain extension
2013 ~ 2019 Dankook University (EEE), BS
2019 ~ 2021 Sogang University (EE), MS
2021 ~ Samsung Electronics
Thesis
Tri-State Nanoelectromechanical (NEM) Memory Switches for an Efficient Routing in Reconfigurable Logic
2014 ~ 2020 Sogang University (EE), BS
2020 ~ 2022 Sogang University (EE), MS
2022 ~ Samsung Electronics
Thesis
Design of Ternary Content-Addressable Memory Using Nanoelectromechanical (NEM) Memory Switches
2015 ~ 2020 Inha University (MSE), BS
2020 ~ 2022 Sogang University (EE), MS
2022 ~ Samsung Electronics
Thesis
Multi-Layer Nanoelectromechanical (NEM) Memory Switches for Efficient Routing Operation
2014 ~ 2020 Sogang University (EE), BS
2020 ~ 2022 Sogang University (EE), MS
2022 ~ Samsung Electronics
Thesis
Analysis of the Gate-Diagonal Tunneling Suppression Effect Using Oxide-Trapped Charge
Woo, Jae Seung
2016 ~ 2020 Sogang University (EE), BS
2020 ~ 2022 Sogang University (EE), MS
2022 ~ Seoul National U. (EE), PhD student
Thesis
Investigation of Hot Carrier Injection in Tunnel Field-Effect Transistors
2016 ~ 2021 Sogang University (EE), BS
2021 ~ 2023 Sogang University (EE), MS
2023 ~ Samsung Electronics
Thesis
Nonvolatile memory based on a tunneling field-effect transistor (TFET) using HfO2 trapping layer
Uhm, Ji Ho
2015 ~ 2021 Sogang University (EE), BS
2021 ~ 2023 Sogang University (EE), MS
2023 ~ Samsung Electronics
Thesis
Influence of Azimuthal Charge Redistribution on Data Retention of Hemi-Cylindrical Vertical NAND Flash Memory
2014 ~ 2021 Sogang University (LS, EE), BS
2021 ~ 2023 Sogang University (EE), MS
2023 ~ Seoul National U. (EE), PhD student
Thesis
Electrical Characteristics of Hemi-Cylindrical Vertical NAND Flash Memory according to Channel Hole Remaining Ratio
Lee, Si Youn
2014 ~ 2021 Dankook University (EEE), BS
2021 ~ 2023 Sogang University (EE), MS
2023 ~ Samsung Electronics
Thesis
Snapback Breakdown Voltage Dependence on Source/Drain Configuration in Multi-Finger MOSFETs
2017 ~ 2021 Chungnam National U. (EE), BS
2021 ~ 2023 Sogang University (EE), MS
2023 ~ Samsung Electronics
Thesis
Analysis of Electrical Characteristics of PNPN Tunnel Field-Effect Transistors by Pocket Design
Kwak, Kyung Wook
2016 ~ 2022 Sogang University (EE), BS
2022 ~ 2024 Sogang University (EE), MS
2024 ~ Samsung Electronics
Thesis
Reliability of the Multi-Finger Gate High-Voltage MOSFETs for the NAND Flash Memory
2016 ~ 2022 Sogang University (EE), BS
2022 ~ 2024 Sogang University (EE), MS
2024 ~ Samsung Electronics
Thesis
Side-Gate MOSFETs for the Suppression of Off-State Breakdown