Jani Babu Shaik, Sonal Singhal, Nilesh Goel, Atul Ranjan Srivastava, and Siona Menezes Picardo,  "rel-SLIFMEM: Design and Analysis of a Reliability-Aware Neuromorphic System" Integration, vol (105), Nov 2025, doi: 10.1016/j.vlsi.2025.102499

S. A. Shaik, Jani Babu Shaik, Anandarup Goswami, "Ethidium bromide adsorption on pyrophyllite nanoclay: Insights from batch, thermodynamic, kinetic, and recyclability studies and optimization through response surface methodology", Colloids and Surfaces A: Physicochemical and Engineering Aspects, Vol (692), July 2024, doi: 10.1016/j.colsurfa.2024.133900

Jani Babu Shaik, X. Guo and S. Singhal, "Impact of Aging and Process Variability on SRAM-Based In-Memory Computing Architectures," in IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 71, no. 6, pp. 2696-2708, June 2024, doi: 10.1109/TCSI.2024.3381935 

Jani Babu Shaik, S. M. Picardo, S. Singhal, and N. Goel, “Reliability-aware design of Integrate-and-Fire silicon neurons,” Integration, vol. 94, p. 102101, Jan. 2024, doi: 10.1016/j.vlsi.2023.102101

S. M. Picardo, Jani Babu Shaik, S. Singhal, and N. Goel, “Enabling efficient rate and temporal coding using reliability‐aware design of a neuromorphic circuit,” International Journal of Circuit Theory and Applications, vol. 50, no. 12, pp. 4234–4250, Dec. 2022, doi: 10.1002/cta.3395 

Jani Babu Shaik, A. VS, S. Singhal, and N. Goel, “Reliability‐aware design of temporal neuromorphic encoder for image recognition,” International Journal of Circuit Theory and Applications, vol. 50, no. 4, pp. 1130–1142, Apr. 2022, doi: 10.1002/cta.3209

Jani Babu Shaik, S. Singhal, S. M. Picardo, and N. Goel, “Impact of various NBTI distributions on SRAM performance for FinFET technology,” Integration, vol. 83, pp. 60–66, Mar. 2022, doi: 10.1016/j.vlsi.2021.12.005

S. M. Picardo, Jani Babu Shaik, N. Goel, and S. Singhal, “Integral impact of PVT variation with NBTI degradation on dynamic and static SRAM performance metrics,” International Journal of Electronics, vol. 109, no. 2, pp. 293–316, Feb. 2022, doi: 10.1080/00207217.2021.1908628

Jani Babu Shaik, S. Singhal, and N. Goel, “Analysis of SRAM metrics for data dependent BTI degradation and process variability,” Integration, vol. 72, pp. 148–162, May 2020, doi: 10.1016/j.vlsi.2020.01.006

A. R. Srivastava, Jani Babu Shaik, S. Singhal and A. V. Singh, "Aging Analysis of Various SRAM Cells Under Diverse Workload Condition," 2025 IEEE 5th International Conference on VLSI Systems, Architecture, Technology and Applications (VLSI SATA), Bangalore, India, 2025, pp. 1-6, doi: 10.1109/VLSISATA65374.2025.11070124

K. Negi, Jani Babu Shaik, S. M. Picardo, S. Singhal and N. Goel, "Aging Analysis of CMOS Based Synaptic Circuits," 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), Bangalore, India, 2024, pp. 1-3, doi: 10.1109/EDTM58488.2024.10512304

Jani Babu Shaik, S. M. Picardo, S. Singhal and N. Goel, "Impact of Reliability Issues and Process Variability in Neuromorphic Circuits," 2022 IEEE Region 10 Symposium (TENSYMP), Mumbai, India, 2022, pp. 1-6, doi: 10.1109/TENSYMP54529.2022.9864348

S. M. Picardo, Jani Babu Shaik, S. Singhal and N. Goel, "Device Reliability Affecting Coding Schemes in Neuromorphic Circuits," 2022 IEEE Region 10 Symposium (TENSYMP), Mumbai, India, 2022, pp. 1-6, doi: 10.1109/TENSYMP54529.2022.9864392.

A. VS, Jani Babu Shaik, S. Singhal, S. M. Picardo, and N. Goel, “Design and Mathematical Modelling of Inter Spike Interval of Temporal Neuromorphic Encoder for Image Recognition,” in 2020 5th IEEE International Conference on Emerging Electronics (ICEE), IEEE, Nov. 2020, pp. 1–4. doi: 10.1109/ICEE50728.2020.9777025

Jani Babu Shaik et al., “Investigating the Impact of BTI and HCI on Log-Domain Based Mihalas–Niebur Neuron Circuit,” 2020, pp. 528–536. doi: 10.1007/978-981-15-4775-1_57

P. K. Gill, Jani Babu Shaik, S. Singhal, and N. Goel, “FPGA Implementation of Random Feature Mapping in ELM Algorithm for Binary Classification,” 2020, pp. 504–510. doi: 10.1007/978-981-15-4775-1_54

S. M. Picardo, Jani Babu Shaik, S. Sahni, N. Goel, and S. Singhal, “Analyzing the Impact of NBTI and Process Variability on Dynamic SRAM Metrics Under Temperature Variations,” 2020, pp. 608–616. doi: 10.1007/978-981-15-4775-1_66

Jani Babu Shaik S. P. Chaudhari, S. Singhal, and N. Goel, “Analyzing Impact of NBTI and Time-Zero Variability on Dynamic SRAM Metrics,” in 2018 15th IEEE India Council International Conference (INDICON), IEEE, Dec. 2018, pp. 1–5. doi: 10.1109/INDICON45594.2018.8986975

S. P. Chaudhari, Jani Babu Shaik, S. Singhal and N. Goel, "Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation," 2018 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS), Hyderabad, India, 2018, pp. 90-93, doi: 10.1109/iSES.2018.00028