Domestic Journals

Domestic Journals

1.  J. Ha, M. Bang, D. Lee, M. Suh, M. Ryu, and J. Kim*, "Deep Learning Approach for Electrical Characteristics Analysis of 3D Vertical SONOS NAND FLASH by Grain Boundary Distribution and Geometrical Variation", Journal of the Institute of Electronics and Information Engineers, 61(4), 13-20, 2024.

2. M. Ryu, J. Ha, G. Lee, M. Suh, M. Bang, D. Lee, and J. Kim*, “Prediction of Degradation Characteristics in Saddle Fin DRAM Due to Total Ionizing Dose and Displacement Defect using Deep Neural Network”, Journal of the Institute of Electronics and Information Engineers, 60(11), 29-37, 2023.

3. J. Ha, G. Lee, M. Suh, M. Bang, T. Kim, and J. Kim*, “Deep Learning Approach for Characteristics Prediction of Nanowire FETs by Process Condition”, Journal of the Institute of Electronics and Information Engineers,59(12), 29-37, 2022.

4. G. Lee, and J. Kim*, “Effect of Radiation Displacement Defect on Superjunction MOSFET using TCAD Simulation”, The Transactions of the Korean Institute of Electrical Engineers, vol. 58, no. 8, pp. 713~719, 2021.

5.  G. Park, and J. Kim*, “Study of Geometry Parameter Variation in Nanosheet Field Effect Transistor using Machine-learning Methods”, The Transactions of the Korean Institute of Electrical Engineers, vol. 58, no. 8, pp. 707~712, 2021.

6.  G. Lee, J. Ha, and J. Kim*, “The Study on Machine Learning Approach for Optimization of Superjunction MOSFET”, The Transactions of the Korean Institute of Electrical Engineers, vol. 70, no. 10, pp. 1475~1480, 2021.

7.  J. Kim*, “Impact of Displacement Defect on Laterally Diffused MOS (LDMOS) using Numerical Simulation”, The Transactions of the Korean Institute of Electrical Engineers, vol. 69, no. 10, pp. 1470~1473, 2020.

8.  J. Kim*, “Optimization and Analysis of Doping Concentration in Insulated-Gate Bipolar Transistor using Machine-Learning Method”, The Transactions of the Korean Institute of Electrical Engineers, vol.69, no.11, pp.1~, 2020.