J.Kim, H. Oh, T. Rim, C.-K. Baek, and J.-S. Lee, "Various Heterojunction Single Gate Tunneling FETs with Graded Channel Doping in Sub- 40 nm Channels", The 22th Korean Conference on Semiconductors (KCS 2015), 인천 송도컨벤시아, Feb. 10-12, 2015.
J.Kim, B. Jin, H. Oh, C.-K. Baek, and J.-S. Lee, "The Statistical Distribution of Electrical Characteristics with Random Grain Boundary in Vertical NAND Unit Cells", The 22th Korean Conference on Semiconductors (KCS 2015), 인천 송도컨벤시아, Feb. 10-12, 2015.
J. Kim, H. Oh, J. Lee, J. Kim, C.-K. Baek, and J.-S. Lee, “3D Simulation of Threshold Voltage Variations Due to Random Grain Boundary and Discrete Dopants in Sub-20 nm Gate-AllAround Poly-Si Transistors”, The 21th Korean Conference on Semiconductors (KCS 2014), Seoul (Hanyang Univ.), Feb. 24-26, 2014.
D. Kang, J. Kim, B. Jin, C.-K. Baek, and J.-S. Lee, "Improved performance of In2Se3 nanowire device with thermal boundary resistance (TBR) for phase change memory application," The 20th Korean Conference on Semiconductors (KCS 2013), 웰리힐리파크, Feb. 4-6, 2013.