2011. 03 ~ 2016. 02:
Ph.D. in Pohang University of Science and Technology (POSTECH), Pohang, Republic of Korea.
2022. 11 ~ Now
IEEE Senior Member(EDS)
2024.03.~Now: Associate Professor in Department of Electrical Engineering of Gyeongsang National University
2024.06.~Now: Deputy Director of Glocal Project Organization
2020.03.~2024.02.: Assistant Professor in Department of Electrical Engineering of Gyeongsang National University
2023.09.~ Now: Korea Institute of Electrical Engineering, Committee Member
2022.11.~ Now: IEEE Senior Member(Electron Device Socitey)
2023.06~2025.05.: Director, Convergence and Open Sharing System(COSS) of Semiconductor Material, Component, Equipment
2021.08.~ 2023.08.: Dean of Electrical Engineering Department, Gyeongsang National University
2023.03.~ 2023.08.: Dean of Electrical Energy Department, Gyeongsang National University
2021.03~2023.02: Center Chief, Company-University Collaboration Center, Gyeongsang National University
2019.04 ~ 2020.02: Design Technology Co-Optimization in Samsung Electronics
Research title: DRAM D1a-node Peripheral transistor calibration & Reliability development.
2018.04 ~ 2019.03: Postdoctoral Researcher (Team head: Dr. M. Meyyappan) in NASA Ames research center, CA, USA
Research title: Reliability of silicon channel transistor due to radiation effect
2016. 02 ~ 2018. 03: TCAD & Device Engineer in SK Hynix
Research title: Modeling of NAND cell transistors for 64/96/128-stacks 3D NAND flash memory
D1x/1y node Peripheral transistor calibration & Reliability development
2023.09.~2027.02.: NRF, Individual Research Project(중견연구)
2023.07.~2024.07.: MonolithIC-3D, Advanced NOR Modeling Project
2023.05. ~ 2023.12.: Development of low temperature DRAM measurement System, LINK 3.0+ Project(2nd stage)
2023.05. ~ 2023.12.: Ministry of SMEs and Startups:Center for Entrepreneurship
2023.03. ~ 2023.12.: Korea-Radiation Institute: Reliability study of DRAM with Total Ionizing Dose (TID) Effect for nuclear plant
2022.08. ~ 2023.01.: Development of low temperature DRAM measurement System, LINK 3.0+ Project(1st stage)
2022.03. ~ 2022.12.: Korea-Radiation Institute: Reliability study of DRAM with Total Ionizing Dose (TID) Effect for nuclear plant
2020.09. ~.2023.02.: ICT of Ministry (NRF): Effect of radiation on nanosheet Logic FETs based on numerical Simulation.
2015.08. ~ 2016. 02.: SK Hynix: Vertical 3D NAND Flash’s Reliability
2014.03. ~ 2016. 02.: Samsung Display: Vertical Low Temperature Poly-Si (LTPS) TFT
2011.07. ~ 2016. 02.: Samsung Electronics: Vertical 3D NAND Flash Memory Modeling & Poly-Si channel TCAD Simulation
2023.09.~ Now: Korea Institute of Electrical Engineering, Study Committee Member
2023.06.~Now: Director, Convergence and Open Sharing System(COSS) of Semiconductor Material, Component, Equipment
2022.12.~Now: IEEE Senior Member, IEEE