Education

•  2011. 03 ~ 2016. 02:

Ph.D. in Pohang University of Science and Technology (POSTECH), Pohang, Republic of Korea.

•  2022. 11 ~ Now

IEEE Senior Member(EDS)
 

Industry/Academic Experiences  

• 2024.03.~Now: Associate Professor in Department of Electrical Engineering of Gyeongsang National University

• 2024.06.~Now: Deputy Director of Glocal Project Organization

• 2020.03.~2024.02.: Assistant Professor in Department of Electrical Engineering of Gyeongsang National University

• 2023.09.~ Now: Korea Institute of Electrical Engineering, Committee Member

• 2022.11.~ Now: IEEE Senior Member(Electron Device Socitey)

• 2023.06~2025.05.: Director, Convergence and Open Sharing System(COSS) of Semiconductor Material, Component, Equipment

• 2021.08.~ 2023.08.: Dean of Electrical Engineering Department, Gyeongsang National University

• 2023.03.~ 2023.08.: Dean of Electrical Energy Department, Gyeongsang National University

• 2021.03~2023.02: Center Chief, Company-University Collaboration Center, Gyeongsang National University

• 2019.04 ~ 2020.02: Design Technology Co-Optimization in Samsung Electronics

  • • Research title: DRAM D1a-node Peripheral transistor calibration & Reliability development.

• 2018.04 ~ 2019.03: Postdoctoral Researcher (Team head: Dr. M. Meyyappan) in NASA Ames research center, CA, USA

  • • Research title: Reliability of silicon channel transistor due to radiation effect

• 2016. 02 ~ 2018. 03: TCAD & Device Engineer in SK Hynix

  • • Research title: Modeling of NAND cell transistors for 64/96/128-stacks 3D NAND flash memory

    • D1x/1y node Peripheral transistor calibration & Reliability development 

Projects 

• 2023.09.~2027.02.:  NRF, Individual Research Project(중견연구)

• 2023.07.~2024.07.: MonolithIC-3D, Advanced NOR Modeling Project

• 2023.05. ~ 2023.12.: Development of low temperature DRAM measurement System, LINK 3.0+ Project(2nd stage)

• 2023.05. ~ 2023.12.: Ministry of SMEs and Startups:Center for Entrepreneurship

• 2023.03. ~ 2023.12.: Korea-Radiation Institute: Reliability study of DRAM with Total Ionizing Dose (TID) Effect for nuclear plant

• 2022.08. ~ 2023.01.: Development of low temperature DRAM measurement System, LINK 3.0+ Project(1st stage)

• 2022.03. ~ 2022.12.: Korea-Radiation Institute: Reliability study of DRAM with Total Ionizing Dose (TID) Effect for nuclear plant

• 2020.09. ~.2023.02.: ICT of Ministry (NRF): Effect of radiation on nanosheet Logic FETs based on numerical Simulation.

• 2015.08. ~ 2016. 02.: SK Hynix: Vertical 3D NAND Flash’s Reliability 

• 2014.03. ~ 2016. 02.: Samsung Display: Vertical Low Temperature Poly-Si (LTPS) TFT 

• 2011.07. ~ 2016. 02.: Samsung Electronics: Vertical 3D NAND Flash Memory Modeling & Poly-Si channel TCAD Simulation

Activities 

• 2023.09.~ Now: Korea Institute of Electrical Engineering, Study Committee Member

• 2023.06.~Now: Director, Convergence and Open Sharing System(COSS) of Semiconductor Material, Component, Equipment

• 2022.12.~Now: IEEE Senior Member, IEEE