Prof. yuan-Fu Yang
Education
Ph.D in College of Electrical Engineering and Computer Science, National Tsing Hua University
Academic Expertise
Machine Learning, Deep Learning, Computer Vision, Generative AI, 3D Reconsturction, Large Multimodal Model
Awards
2023 TSMC ESG Competition Best Award
2023 CVPR (Vancouver) TechArt Piece Selected for Exhibition
2022 TSMC Collaboration for Internal Control Excellence Symposium First Award
2021 Linz Electronic Arts Festival (Austria) TechArt Piece Selected for Exhibition.
2021 National Tsing Hua University International Paper Best Award
2020 SEMI Advanced Semiconductor Manufacturing Conference Best Paper Award
2020 TSMC Machine Learning Competition First Runner-up
2018 TSMC Kaggle Competition First Award
2011, 2015, 2016 TSMC CIT Competition Frist Award
2011, 2016 TSMC Annual First Award
Activities
2017 - 2023: Quality & Reliability, TSMC
Member of CIT Competition Juror
2022 - now: Reviewer
Computer Vision and Pattern Recognition Conference (CVPR)
International Conference on Computer Vision (ICCV)
IEEE Transactions on Neural Networks and Learning Systems (TNNLS)
IEEE Transactions on Instrumentation and Measurement (TIM)
Publications
"QRF: Implicit Neural Representations with Quantum Radiance Fields", arXiv preprint arXiv:2211.03418.
"SARS-COV-2 Painting Creation by Generative Model", The IEEE / CVF Computer Vision and Pattern Recognition Conference (CVPR 2023) Demo.
"Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning", The IEEE / CVF Computer Vision and Pattern Recognition Conference (CVPR 2022).
"Hybrid Quantum-Classical Machine Learning for Lithography Hotspot Detection", 2022 Semi Advanced Semiconductor Manufacturing Conference (ASMC 2022).
"Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network", IEEE Transactions on Semiconductor Manufacturing (TSM 2021).
"Medium. Permeation", TechArt Work, Ars Electronica Festival (2021).
"A Novel Deep Learning Architecture for Global Defect Classification: Self-Proliferating Neural Network (SPNet)", 2021 Semi Advanced Semiconductor Manufacturing Conference (ASMC 2021).
"Double Feature Extraction Method for Wafer Map Classification based on Convolution Neural Network", 2020 Semi Advanced Semiconductor Manufacturing Conference (ASMC 2020).
"A Deep Learning Model for Identification of Defect Patterns in Semiconductor Wafer Map", 2019 Semi Advanced Semiconductor Manufacturing Conference (ASMC 2019).
"The Economics of Preventive Maintenance – A Grouping Genetic Algorithm Approach", 2006 36th International Conference on Computers and Industrial Engineering (ICCIE 2006).