Epsilometer - Dielectric Materials Measurement

Epsilometer solution for measuring the dielectric properties of materials measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.

CMT R60 Vector Reflectometer

Frequency range: 10 MHz to 6 GHz
Impedance: 50 Ohm

Epsilometer Applications

Epsilometer can be used in design and manufacturing of microwave circuit materials, antenna radomes, antenna substrates, packaging for wireless devices – 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. – and many other applications.

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