Thin-Film Transistors

Representative Publications

1) Sung-Hwan Choi and Min-Koo Han, "Effect of channel widths on negative shift of threshold voltage, including stress-induced hump phenomenon in InGaZnO thin-film transistors under high-gate and drain bias stress", Applied Physics Letters, Vol. 100, No.4, pp. 043503-1-043503-3, January, 2012. (SCIE, Impact Factor: 3.597 (2019) DOI: 10.1063/1.3679109

2) Sung-Hwan Choi, Jun-Hyuk Jang, Jang-Joo Kim, and Min-Koo Han, "Low-Temperature Organic (CYTOP) Passivation for Improvement of Electric Characteristics and Reliability in IGZO TFTs", IEEE Electron Device Letters, Vol. 33, No.3, pp. 381-383, March, 2012. (SCIE, Impact Factor: 4.221 (2019) DOI: 10.1109/LED.2011. 2178112

3) Sung-Hwan Choi and Min-Koo Han, "Effect of Deposition Temperature of SiOx Passivation Layer on the Electrical Performance of a-IGZO TFTs", IEEE Electron Device Letters, Vol. 33, No.3, pp. 396-398, March, 2012. (SCIE, Impact Factor: 4.221 (2019) DOI: 10.1109/LED.2011.2181320

4) Sung-Hwan Choi and Min-Koo Han, "Highly Reliable Multiple-Channel IGZO Thin-Film Transistors Employing Asymmetric Spacing and Channel Width", IEEE Electron Device Letters, Vol. 34, No.6, pp. 771 - 773, June, 2013. (SCIE, Impact Factor: 4.221 (2019) DOI: 10.1109/LED.2013.2256457

5) Sung-Hwan Choi, "High-performance Oxide TFTs with Co-Sputtered Indium Tin Oxide and Indium-Gallium -Zinc Oxide at Source and Drain Contacts", IEEE Electron Device Letters, Vol. 42, No.2, pp. 168 - 171, Feburuary, 2021. (SCIE, Impact Factor: 4.221 (2019) DOI: 10.1109/LED.2020.3047389