Refereed Journals

국제논문지 (International Journal)

12. “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip”

      Seung-Han Lee, Jin Hwan Park, Young-woo Lee

      IEEE Access

      vol.13, pp.37493-37600, February 2025

11. “Timestamp-Based Secure Shield Architecture for Detecting Invasive Attacks”

      JunYeong Bae, Junseok Oh, Myoung Jin Lee, Young-woo Lee

      IEEE Transactions on Very Large Scale Integration (VLSI) Systems (IEEE TVLSI)

      vol.31, no.9, pp.1358-1367, September 2023

10. “Row Hammer Reduction Using a Buried Insulator in a Buried Channel Array Transistor”

      Jin Hyo Park, Su Yeon Kim, Dong Young Kim, Geon Kim, Je Won Park, Sunyoung Yoo, Young-woo Lee, Myoung Jin Lee

      IEEE Transactions on Electron Devices (IEEE TED)

      vol.69, no.12, pp.6710-6716, December 2022

09. “4-Pole Hybrid HVDC Circuit Breaker for Pole-to-Pole (PTP) Fault Protection”

      Geon Kim, Jin Hyo Park, Su Yeon Kim, Tae Hoon Kim, Han Seung Jang, Young-woo Lee, Myoung Jin Lee

      IEEE Access

      vol.10, no.1, pp.9789-9979, December 2022

08. “Reduced-Pin-Count BOST for Test-Cost Reduction”

      Youngkwang Lee, Young-woo Lee, Sungyoul Seo, Sungho Kang

      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (IEEE TCAD)

      vol.41, no.3, pp.750-761, March 2022

07. “Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks”

      Young-woo Lee, Hyeonchan Lim, Youngkwang Lee, Sungho Kang

      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (IEEE TCAD)

      vol.39, no.10, pp.3023-3034, October 2020

06. “Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing”

      Sungyoul Seo, Young-woo Lee, Hyeonchan Lim, Sungho Kang

      IEEE Transactions on Semiconductor Manufacturing (IEEE TSM)

      vol.33, no.3, pp.391-403, August 2020

05. “A Low-cost Concurrent TSV Test Architecture with Lossless Test Output Compression Scheme”

      Young-woo Lee, Hyeonchan Lim, Sungyoul Seo, Keewon Cho, Sungho Kang

      Public Library of Science One (PLOS ONE)

      vol.14, no.8, pp e0221043, August 2019

04. “An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults”

      Keewon Cho, Young-woo Lee, Sungyoul Seo, Sungho Kang

      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (IEEE TCAD)

      vol.38, no.3, pp.551-561 , March 2019

03. “Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost”

      Inhyuk Choi, Hyunggoy Oh, Young-woo Lee, Sungho Kang

      IEEE Transactions on Computers (IEEE TCOM)

      vol.67, no.12, pp1835-1839, December 2018

02. “A Statistic-based Scan Chain Reordering for Energy-Quality Scalable Scan Test”

      Sungyoul Seo, Keewon Cho, Young-woo Lee, Sungho Kang

      IEEE Journal on Emerging and Selected Topics in Circuits and Systems (IEEE JETCAS)

      vol.8, no.3, pp 391-403, September 2018

01. “Grouping-based TSV Test Architecture for Resistive Open and Bridge Defects in 3D-ICs”

      Young-woo Lee, Hyeonchan Lim, and Sungho Kang

      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (IEEE TCAD)

      vol.36, no.10, pp.1759-1763, October 2017

국내논문지 (Domestic Journal)

05. “메모리 테스트 패턴 호환성 향상을 위한 고급언어 컴파일러 구조”

      박석민, 이영우

      발행기관 : 반도체공학회, 발행지명 : 반도체공학회논문지

      vol.3, no.1, pp 01-07, April 2025

04. “비트맵 데이터 학습을 통한 딥러닝 기반의 메모리 수리 예측 기술 연구”

      김광역, 노순혁, 양다빈, 이영우

      발행기관 : 한국디지털콘텐츠학회, 발행지명 : 디지털콘텐츠학회논문지

      vol.25, no.10, pp 3053-3059, October 2024

03. “광학 문자 인식 기술을 활용한 점자 변환 시스템의 설계 및 구현”

      김광역, 노순혁, 양다빈, 이영우

      발행기관 : 한국디지털콘텐츠학회, 발행지명 : 디지털콘텐츠학회논문지

      vol.24, no.11, pp 2963-2970, November 2023

02. “교통사고 저감을 위한 인공지능 기반 인캐빈 모니터링 시스템”

      강창우, 김철중, 이가영, 이영우

      발행기관 : 한국디지털콘텐츠학회, 발행지명 : 디지털콘텐츠학회논문지

      vol.24, no.11, pp 2759-2766, November 2023

01. “침투 공격 검출을 위한 비대칭 신호 스캐닝 기법”

      양다빈, 이가영, 이영우

      발행기관 : (사)한국스마트미디어학회, 발행지명 : 스마트미디어저널

      vol.12, no.1, pp.17-23, February 2023