International Conferences

국제학회 (International Conferences)

21. “Directional Fault Masking Scheme for Radiation-Resilient LUTs”

      Juhyeong Jo, Jaehwan Shin, Minsuk Sung, Bo-In Park, Ji-Hoon Kang, Young-woo Lee

The Institute of Semiconductor Engineers(ICOS)

      January 2026

20. “A Two-Phase Test Point Insertion Scheme for Low-Power Scan Testing”

      Seongjin Lee, Hyunbeen Kim, Sunghun Jung, Jin Hwan Park, Minsuk Sung, Young-woo Lee

International Conference On Consumer Electronics(ICCE) Asia

      October 2025

19. “Error-Correction Circuit based PUF Structure for High Reliability SSN”

      Byeongmin Choi, Sungkwang Yoon, Taeuk Im, Jin Hwan Park, Minsuk Sung, Young-woo Lee

International Conference On Consumer Electronics(ICCE) Asia

      October 2025

18. “SDC-aware Masking Scheme for Biased SEUs and Directional Bit-Flipping”

      Juhyeong Jo, Jaehwan Shin, Young-woo Lee

      International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)

      July 2025

17. “A Self-Recovery Scheme for Fault Tolerance and Side-Channel Resistance in Systolic Arrays”

      Chanhyeok Bang, Sungkwang Yoon, Young-woo Lee

      International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)

      July 2025

16. “Optimized Instruction Set Architecture for Programmable Memory Test Pattern Generation”

      Seokmin Park, Jewoo Park, Young-woo Lee

      IEEE International SOC Design Conference (ISOCC)

      August 2024

15. “Production-Oriented Design for High Parallel Test Efficiency”

      Jaehwan Shin, Young-woo Lee

      IEEE International SOC Design Conference (ISOCC)

      August 2024

14. “Reduced Pin-Count Test Scheme for High Parallel Test Capabilities”

      Jaehwan Shin, Junyeong Bae, Young-woo Lee

      IEICE Asia-Pacific Workshop on Advanced Semiconductor Devices (AWAD 2023)

      June 2023

13. “Output Compression Scheme of Multi-Site Testing for System-on-Chip”

      Hyunbeen Kim, Junyeong Bae, Young-woo Lee

      IEICE Asia-Pacific Workshop on Advanced Semiconductor Devices (AWAD 2023)

      June 2023

12. “Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction"

      Seokmin Park, Gayeong Lee, Jaehwan Shin, Seunghan Lee, Young-woo Lee

      IEEE International Conference on Artificial Intelligence in Information and Communication (ICAIIC)

      March 2023

11. “Tunable Compact Probing Detector with Fast Analysis Time Against Invasive Attacks”

      Young-woo Lee, Youngkwang Lee, Minho Moon and Sungho Kang

      IEEE International SOC Design Conference (ISOCC)

      October 2019

10. “2-D failure bitmap compression using line fault marking method”

      Keewon Cho, Young-woo Lee, Sungyoul Seo and Sungho Kang

      IEEE International SOC Design Conference (ISOCC)

      November 2018

09. “An Efficient Built-in Self-Repair Scheme for Area Reduction”

      Keewon Cho, Young-woo Lee, Sungyoul Seo, and Sungho Kang

      IEEE International SOC Design Conference (ISOCC)

      November 2017 (Honored with Best Paper Award)

08. “Test Item Priority Estimation for High Parallel Test Efficiency under ATE Debug Time Constraints”

      Young-woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, and Sungho Kang

      IEEE International Test Conference in Asia (ITC-Asia)

      September 2017

07. “A Test Methodology to Screen Scan-Path Failures”

      Junghwan Kim, Young-woo Lee, Minho Cheong, Sungyoul Seo and Sungho Kang

      IEEE International SOC Design Conference (ISOCC)

      October 2016

06. “A TSV Test Structure for Simultaneously Detecting Resistive Open and Bridge Defects in 3D-ICs”

      Young-woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang

      IEEE International SOC Design Conference (ISOCC)

      October 2016 (Honored with IEEE CASS Seoul Chapter Award)

05. “A Study on Automatic SPI ROM Version Updates for Production”

      Young-woo Lee, Kang-Hoon Oh, Taehwan Kim

      Teradyne User Group Conference (Orlando, FL)

      May 2015

04. “A Study on SPI ROM Write Function with DSSC”

      Young-woo Lee, Kang-Hoon Oh

      Teradyne User Group Conference (Anaheim, CA)

      April 2014

03. “A Study on SPI ROM Slave Protocol Aware”

      Young-woo Lee, Kang-Hoon Oh, Hyoung-Mo Choi, James Paik

      Teradyne User Group Conference (Fort Worth, TX)

      April 2013

02. “New Test Technique for Substituting Serial Measurement with Matrix Measurement”

      Young-woo Lee, Kang-Hoon Oh, Kyung-Kuk Moon

      Teradyne User Group Conference (Fort Worth, TX)

      April 2013

01. “ADC Test with UltraPin1600 Source Synchronous Method”

      Young-woo Lee, Kang-Hoon Oh, Eun-woo Park, Byung-hwa Lee

      Teradyne User Group Conference (Hilton Head, SC)

      May 2012