Patent
Domestic Patent
[9] 반도체 소자의 초기 불량 검출 방법 및 장치(METHOD AND APPARATUS FOR DETECTING INITIAL DEFECTS IN SEMICONDUCTOR)
- 전종욱, 박기론, 선윤근 (건국대학교 산학협력단)
- 국내특허, 출원번호 : 1020210087173 (2021.07.02)
[8] 반도체 소자의 시뮬레이션 방법 및 장치(SEMICONDUCTOR DEVISE SIMULATION METHOD AND APPARRATUS)
- 전종욱, 박기론, 선윤근 (건국대학교 산학협력단)
- 국내특허, 출원번호 : 1020210087266 (2021.07.02)
[7] 회로 시뮬레이션 방법 및 장치(CIRCUIT SIMULATION METHOD AND APPARRATUS)
- 전종욱, 선윤근, 박기론 (건국대학교 산학협력단)
- 국내특허, 출원번호 : 1020210087255 (2021.07.02)
[6] 반도체 집적회로의 수율 예측 장치, 및 이를 이용한 반도체 장치 제조 방법(A APPARATUS FOR PREDICTING A YIELD OF A SEMICONDUCTOR INTEGRATED CIRCUITS, AND A METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME)
- 김성렬, 고정훈, 김성제, 이제현, 전종욱 (삼성전자주식회사)
- 국내특허, 출원번호 : 1020170109787 (2017.08.30)
[5] 회로의 자가 발열 특성을 예측하는 시뮬레이션 시스템 및 그것의 회로 설계 방법(SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT AND DESIGN METHOD THEREOF)
- 전종욱, 윤여일, 배상우, 권의희, 이근호 (삼성전자주식회사)
- 국내특허, 출원번호 : 1020140107135 (2014.08.18), 등록번호 : 1022685910000 (2021.06.17)
[4] SER 예측을 위한 시뮬레이션 방법 및 시스템(SIMULATION METHOD AND SYSTEM FOR PREDICTING SER), 국내특허 출원, 1020160140943 (2016.10.27)
- 몽가유딧, 전종욱, 마치다켄, 권의희 (삼성전자주식회사)
- 국내특허, 출원번호 : 1020140107135 (2014.08.18)
[3] 알티에스(RTS) 노이즈를 고려한 회로 설계 방법 및 시뮬레이션 방법 Circuit Design Method and Simulation Method considering random telegraph signal noise
- 전종욱, 박효은, 권의희, 김종철, 이근호 (삼성전자주식회사)
- 국내특허, 출원번호 : 1020150143047 (2015.10.13), 등록번호 : 1024005570000 (2022.05.17)
[2] 이미지 센서를 제조하는 방법 및 시스템(SYSTEM AND METHOD OF MANUFACTURING IMAGE SENSOR)
- 김요한, 전종욱, 권의희 (삼성전자주식회사)
- 국내특허, 출원번호 : 1020170105509 (2017.08.21)
[1] 반도체 장치(Semiconductor device)
- 배상우, 전종욱, 추승진, 사공현철, 최재희 (삼성전자주식회사)
- 국내특허, 출원번호 : 1020150018562 (2015.02.06), 등록번호 1022874060000 (2021.08.03)
Oversea Patent
[7] Simulation methods and systems for predicting SER
- Udit Monga, Jong Wook Jeon, Ken Machida, Ui Hui Kwon (Samsung Electronics)
- US patent, Application no : 15645227, Registration no : 10783306 (2020.09.22)
[6] Methods and systems for manufacturing image sensors
- Yo-han Kim, Jong-Wook Jeon, Ui-hui Kwon (Samsung Electronics)
- US patent, Application no : 15869466 (2018.01.12), Registration no : 10529779 (2020.01.07)
[5] Circuit design method and simulation method based on random telegraph signal noise
- Jong-Wook Jeon, Hyo-Eun Park, Keun-Ho Lee, Ui-hui Kwon, Jong-Chol Kim (Samsung Electronics)
- US patent, Application no : 15287354 (2016.10.06), Registration no : 10311187 (2019.06.04)
[4] Semiconductor device including a fin pattern
- Sang-Woo Pae, Jong-Wook Jeon, Seung-Jin Choo, Hyun-Chul Sagong, Jae-Hee Choi (Samsung Electronics)
- US patent, Application no : 14961259 (2015.12.07), Registration no : 09728486 (2017.08.08)
[3] SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT AND DESIGN METHOD THEREOF
- JONGWOOK JEON, YEOIL YUN, SANGWOO PAE, UIHUI KWON, KEUNHO LEE (Samsung Electronics)
- US patent, Application no : 16280205 (2019.02.20)
[2] CIRCUIT DESIGN METHOD AND SIMULATION METHOD BASED ON PROCESS VARIATION CAUSED BY AGING
- JONG-WOOK JEON, JAE-HEE CHOI, YOO-HWAN KIM, KEUN-HO LEE, UI-HUI KWON, JONG-CHOL KIM (Samsung Electronics)
- US patent, Application no : 15251411 (2016.08.30)
[1] Apparatus for predicting yield of semiconductor integrated circuit and method for manufacturing semiconductor device using the same
- Seong Ryeol Kim, Jeong Hoon Ko, Seong Je Kim, Je Hyun Lee, Jong Wook Jeon (Samsung Electronics)
- US patent, Application no : 15901358 (2018.02.21), Registration no : 10614186 (2020.04.07)