I have been an active user of the National Nanofabrication Centre (NNFC) housed in the Centre for Nano Science and Engineering (CeNSE) for the past two years. The NNFC comprises of class 100 and class 1000 cleanrooms with state-of-the-art fabrication and in-line characterization tools. Almost all complex devices (excluding ion implantation) can be fabricated in this facility. Few of the tools that I have been using regularly for fabricating beta-Gallium Oxide devices are -
Lithography - Heidelberg maskless aligner, Raith e-line electron beam lithography, Suss MicroTec Mask aligner (contact lithography)
Dry Etching - Reactive Ion Etching, plasma asher
Physical Deposition - E-beam evaporator, DC magnetron sputtering, RF magnetron sputtering, Atomic Layer Deposition
Chemical Vapor Deposition (CVD) - Plasma-Enhanced CVD (PECVD), Inductively-coupled Plasma CVD (ICP-CVD)
Inline Characterisation - Ellipsometer, Dektak XT surface profiler
The fabricated beta-Gallium Oxide devices are being characterized for performance and reliability using novel experimental techniques. I have been using the following electrical characterization tools housed in the Advanced Nano Characterization Facility (ANCF) for this purpose -
Ever being Manual Probe Station, Cascade Microtech Summit 12000 Semi-automatic 6-inch Wafer Prober
Keithley SMUs (2657A High power, 2635A single channel, 2636A dual channel), 4200A SCS Parameter Analyser
Microsanj NT220C (Nanosecond Transient Thermal Imager)
Auriga Au-5 Pulse IV/RF Characterisation System
High Power Pulse Instruments GmbH - TLP-4010C pulse generator, TLP-3011C pulse width extender, S-4000A (18 GHz Low Triboelectric System Switch)
I have been using a range of material characterization techniques in conjugation with electrical characterization methods to gain a deeper understanding of the physical mechanism behind the observed device behavior. Few of the material characterization techniques in which I am well versed are -
Scanning Electron Microscopy (SEM), Focussed Ion Beam (FIB), and Transmission Electron Microscopy (TEM) tools available at the Micro and Nano Characterization Facility (MNCF) housed in the Centre for Nano Science and Engineering (CeNSE) and the Advanced Facility for Microscopy and Microanalysis (AFMM).
Labram HR Raman Spectroscopy and Atomic Force Microscopy (AFM) at the Advanced Nano Characterization Facility (ANCF), Department of Electronic Systems Engineering (ESE).
Development of the beta-Gallium Oxide technology using a co-design approach requires the development of experimental or computational models to relate the observed device behavior with the device design parameters. Using the developed models, the device design can be sufficiently tweaked to obtain devices with higher performance and reliability. Computational models validated with experimental results are generally preferred over experimental models due to the involved savings of time and resources. I am using Sentaurus TCAD for performing device computations.