Teaching

Atomic Force Microscopy (AFM) involves a tip scanning across the specimen surface to obtain information about the surface depending on the force of interaction between the tip and specimen. Different topics covered in this section are history of the development of AFM, tip-sample interaction, basic physics of AFM for surface imaging, different modes of AFM operation, details about the state-of-the-art AFM tools, and other advanced AFM techniques. 

You can attempt the online quiz at https://forms.gle/qZEvRS77xKEufsRX7 to test your understanding of AFM.

Scanning Electron Microscopy (SEM) primarily involves high-resolution imaging of the specimen surface by detection of radiations reflected back from the sample following impinging of an electron beam on it. Different topics covered in this section are basic physics of imaging using electrons, details of state-of-the-art SEM tools, detailed guidelines for operating the SEM tool and obtaining a good quality SEM image, and other specialized SEM techniques.

Attempt the online quiz at https://forms.gle/GeBBeSKjtm7L9G4u6 to test your understanding of SEM.

Focussed Ion Beam (FIB) involves use of an ion beam for surface imaging, micro-machining, selective etching, site-specific chemical vapor deposition, and so on. Different topics covered in this section are basic physics of ion-specimen interaction, details about the state-of-the-art SEM-FIB tools, and various applications of FIB.

Attempt the online quiz available at https://forms.gle/FU1SvRyRq7L9v32G9 to test your understanding of FIB.

Transmission Electron Microscopy (TEM) primarily involves high-resolution imaging and diffraction pattern of sample by detection of electrons transmitted through the sample following impinging of an electron beam on it. Different topics covered in this section are history of the development of TEM, basic physics of TEM for imaging and diffraction, details about the state-of-the-art TEM tools, and specialized TEM techniques.     

Attempt the online quiz available at https://forms.gle/gprhXZzPNn98hckw5 to test your understanding of TEM.

X-ray photoelectron spectroscopy is based on the photoelectric effect. It is a surface-sensitive quantification spectroscopic method that provides the best estimate of the elemental composition of the sample surface. Different topics covered in this section are the basic physics of XPS, ultraviolet photoelectron spectroscopy (UPS) and Auger Electron Spectroscopy, details about state-of-the-art XPS tools, and analysis of XPS spectra. 

Attempt the online quiz at https://forms.gle/Q6NbFY5xUnLgHSjV7 to test your understanding of XPS. 

Raman spectroscopy is based on the inelastic scattering of light by matter. It can be used for the identification and quantification of substances by making use of the Raman spectra, which being unique for each substance act as chemical fingerprints.

Attempt the online quiz at https://forms.gle/t5cETrwPToQykquX9 to test your understanding of Raman spectroscopy.

X-Ray Diffraction (XRD) technique primarily involves determination of the crystalline structure of a sample by making use of the reflected radiation following X-rays impinging on it. Different topics covered in this section are introduction to crystallography, basic physics of X-ray diffraction, details about state-of-the-art X-ray diffractometers, measurement of XRD spectra, and analysis of the obtained spectra to determine different parameters of the sample.  

Attempt the online quiz at https://forms.gle/rT9jB3FZSnvSR2WY6 to test your understanding of XRD.

Electrical properties of electronic devices involve the current-voltage and capacitance-voltage characteristics. Different topics covered in this section are current conduction mechanism in semiconductors, measurement of electrical resistivity and Hall measurements, on-wafer electrical DC measurements and different components of the measurement setup, and capacitance-voltage measurements.

To test your understanding of the topics covered in this section, attempt the quiz at https://forms.gle/eoKUY3j2XtFEg9uu8.

Thermoreflectance is the method of determining the surface temperature by noting the change in the surface reflectivity with change in temperature of the sample. Different topics covered in this section are the different methods of thermal imaging, details about the state-of-the-art Microsanj NanoTherm tools, steps of measurement - calibration and thermal image acquisition, and demo videos on tool operation. 

Attempt the online quiz available at https://forms.gle/H29ooyD1bFoFpY3y6 to test your understanding of Thermoreflectance.

Deep Level Transient Spectroscopy (DLTS) is the method for determination of deep level trap levels within the bandgap of semiconductor.