extreme environment equipment
Embedded Files
Welcome to MiRe - Microelectronic Reliability Laboratory !
Device Characteristics Analysis and Reliability Evaluation
Copyright (C) 2022 Hongik Uni. MiRe Lab. All rights reserved.
[Address] P508, Electronic and Electrical Engineering, Hongik University, 94,
Wausan-ro, Mapo-gu, Seoul, Korea
[TEL] +82-2-320-3013 [FAX] +82-2-320-1193
[Email] hkim@hongik.ac.kr
Google Sites
Report abuse