금동민 (Dongmin Keum)

Hongik Univ.  Electronics and Electrical Engineering, Ph.D

• Research Interest
  Sensors based on GaN HEMT Fabrication

• Email
  rmaehdalf@hanmail.net

• Affiliation
  Samsung electronics

Nguyen Van Cuong

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN semiconductor devices for harsh environment

• Email  
  nvcuong23783@gmail.com

• Affiliation
  Le Quy Don Technical University

윤훈상 (Hoonsang Yoon)

Hongik Univ.  Electrical, Information and Control Engineering, Master

• Research Interest  
  GaN HFET Simulation & OTFT Fabrication

• Email  
  hoonsangyoon@naver.com

• Affiliation
  Hyundai Mobis

최신혁 (Shinhyuk Choi)

Hongik Univ.  Electrical, Information and Control Engineering, Master

• Research Interest
  GaN HEMT Fabrication & Reliability Test

• Email
  shinhyuk001@hanmail.net

• Affiliation
  Samsung Austine Semiconductor

강영진 (Youngjin Kang)

Hongik Univ.  Electrical, Information and Control Engineering, Master

• Research Interest  
  GaN HEMT Simulation & Si(110) CMOS Fabrication

• Email  
  scapall@naver.com

• Affiliation  
  ON Semiconductor

조강호 (Kangho Cho)

Hongik Univ.  Electrical, Information and Control Engineering, Master

• Research Interest 
  GaN HEMT Fabrication

• Email  
  primeevir@naver.com

최준영 (Junyoung Choi)

Hongik Univ.  Electrical, Information and Control Engineering, Master

• Research Interest
  GaN HEMT Simulation & Characterization

• Email
  sjycjy@hanmail.net

• Affiliation
  KEC

조근호 (Geunho Cho)

Hongik Univ.  Electrical, Information and Control Engineering, Master

• Research Interest
  GaN HEMT Fabrication & Reliability test

• Email
  1220cho@hanmail.net

• Affiliation
  ON Semiconductor

조희형 (Heehyeong Cho)

Hongik Univ.  Electrical, Information and Control Engineering, Master

• Research Interest
  GaN HEMT Fabrication & Simulation

• Email
  h.acolyte@gmail.com

• Affiliation
  IP&SP Technology Korea

정구혁 (Guhyeok Chung)

Hongik Univ.  Electronics and Electrical Engineering, Master

• Research Interest
  Sensors based on GaN HEMT Fabrication

• Email  
  guheak92@gmail.com

• Affiliation  
  Samsung electronics

Tuan Anh Vuong

Hongik Univ.  Electronics and Electrical Engineering, Master

• Research Interest
  GaN device fabrication and modeling

• Email tuananhvuong2017@gmail.com

• Affiliation
  Hana micron

양수혁 (Suhyuk Yang)

Hongik Univ.  Electronics and Electrical Engineering, Master

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email  
  9635468@naver.com

• Affiliation
  Samsung electronics

조성인 (Seongin Cho)

Hongik Univ.  Electronics and Electrical Engineering, Master

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email  
  tjddlsaksen@naver.com

• Affiliation
  Samsung electronics

안지환(Jihwan Ahn)

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email
  jihwanch11@naver.com

• Affiliation
  LX semicon

김승환(Seunghwan Kim)

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email
  roqtyd@naver.com

• Affiliation
  Samsung electronics

정준우(Junwoo Jung)

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email
  jjwmms@naver.com

• Affiliation
  ChipsK

윤정혁(Jeonghyeok Yoon)

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email
  jonnyi961@naver.com

이준표(Junpyo Lee)

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email
  wnsvy12316@naver.com

• Affiliation
  DB HiTek

민병문(Byeongmoon Min)

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email
  minjin829@naver.com

이한결(Hangyeol Lee)

• Hongik Univ.  Electronic and Electrical Engineering

• Research Interest
  GaN HEMT Fabrication & Reliability test & Simulation

• Email
  popfun07@naver.com