Welcome to MiRe - Microelectronic Reliability Laboratory !

Students

Ph.D

채명수(Myeongsu Chae)

Hongik Univ. Electronic and Electrical Engineering
Research Interest
The reliability test of p-GaN gate AlGaN/GaN HEMTs
Email
mschae@g.hongik.ac.kr

전민재(Minjae Jeon)

Hongik Univ. Electronic and Electrical Engineering
Research Interest
GaN HEMT Fabrication & Reliability test & Simulation
Email
06bluerose01@naver.com

Master

이서윤(Seoyun Lee)

Hongik Univ. Electronic and Electrical Engineering
Research Interest
GaN HEMT Fabrication & Reliability test & Simulation
Email
dltjdbs3@naver.com

이엘림(Elim Lee)

Hongik Univ. Electronic and Electrical Engineering
Research Interest
GaN HEMT Fabrication & Reliability test & Simulation
Email
dpffladl0@naver.com

이용욱(Yonguk Lee)

Hongik Univ. Electronic and Electrical Engineering
Research Interest
GaN HEMT Fabrication & Reliability test & Simulation
Email
brightugi0910@naver.com

이채림(Chaerim Lee)

Hongik Univ. Electronic and Electrical Engineering
Research Interest
GaN HEMT Fabrication & Reliability test & Simulation
Email
coflalee@naver.com

Copyright (C) 2022 Hongik Uni. MiRe Lab. All rights reserved.

[Address] P508, Electronic and Electrical Engineering, Hongik University, 94,
Wausan-ro, Mapo-gu, Seoul, Korea

[TEL] +82-2-320-3013 [FAX] +82-2-320-1193
[Email] hkim@hongik.ac.kr

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